Jul 27, 2017 
CAMI Research Inc. (Acton, MA) has released a USB Type-C test interface board for its CableEye cable and harness testing systems. A daughter board, populated with two USB-C female connectors, it allows users to continuity-check USB Type-C terminated cables using the CableEye tester while seeing the connectors-undertest rendered graphically. The CB26U fits all CableEye models.
A leader in development of PC-based cable and wire harness, continuity, resistance and hipot test systems for over 20 years, CAMI offers the CableEye suite of products complete with accessories - including “connector boards”. The selection of these test fixture boards is constantly growing and is currently numbering over 60 – most of which are populated with ‘families’ of connectors. When pre-populated boards are used, the tester GUI automatically displays a graphic of the connectors under test.
Sold as a set of two boards, each CB26U accepts two USB Type-C connectors. In addition to the latest CableEye software, it requires the CB26 small-frame motherboard (Item 756) for operation, and plugs into one of two available slots - two USB-C-connectors can be tested simultaneously. The CB26 (with CB26U) attaches to the tester like a regular connector board.
Warranty
All connector boards are included in CableEye’s standard, renewable one-year warranty of the tester for which it was purchased.
Availability & Domestic US Pricing
Available immediately, a CB26U set is $185 (Item 756U), and requires a CB26 set (Item 756) for mounting and the latest CableEye software.
Contact sales@camiresearch.com or (978) 266-2655 for a quote.
Note: Prices are USA only and subject to exchange rates, freight and import costs. Contact your local authorized distributor for local pricing.
CAMI Research produces expandable and upgradable diagnostic Cable & Harness Test Systems for assembly, prototyping, production, and QC of standard or custom cables. CableEye® Testers display, and document basic electrical properties such as continuity, resistance, capacitance, dielectric breakdown, insulation resistance, miswires, and intermittent defects.
