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Akrometrix to Showcase Next-Generation AXP Shadow Moiré System at APEX

Jan 10, 2017

Next-Generation AXP Shadow Moiré System.

Next-Generation AXP Shadow Moiré System.

Akrometrix, LLC, the leading provider of thermal warpage and strain metrology equipment to both the front- and back-end semiconductor and electronics industries, will exhibit in Booth #704 at the 2017 IPC APEX EXPO, scheduled to take place Feb. 14-16, 2017 at the San Diego Convention Center in Calif. The company will demonstrate its next-generation Shadow Moiré System – the AXP 2.0.

Akrometrix has been supplying thermal warpage systems for more than 20 years utilizing the shadow moiré technique. This next-generation AXP system provides unparalleled warpage metrology with state-of-the-art lateral/top-bottom temperature uniformity.

AXP 2.0 is the industry leader in not only providing thermal warpage, but has optional modules for both DIC strain/CTE measurements and DFP for discontinuous surfaces. Utilizing a novel combination of both top and bottom heaters with shadow moiré, Akrometrix is providing temperature uniformity previously unattainable in the industry on a flexible/configurable platform.

For more information about Akrometrix’s warpage metrology systems, please contact sales@akrometrix.com or visit www.akrometrix.com.


Akrometrix is the leader in thermal warpage and strain metrology for the front-end/back-end wafer, back-end packaging/assembly, panel and the PCB/component markets. The company provides both capital equipment and test services to measure warpage and strain in temperatures from -50°C to 300°C on virtually any substrate up to 600mm x 600mm, regardless of shape. Located in Atlanta, Georgia, Akrometrix has been serving customers worldwide for more than 20 years based on technology developed at Georgia Tech. For more information, contact Akrometrix at sales@Akrometrix.com or visit www.akrometrix.com.

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