SMT, PCB Electronics Industry News
  • SMTnet
  • »
  • Industry News
  • »
  • KIC’s MB Allen to Present ‘Optimized Reflow Profiling to Minimize Voiding’ during SMTAI

KIC’s MB Allen to Present ‘Optimized Reflow Profiling to Minimize Voiding’ during SMTAI

Sep 01, 2016

KIC today announced that Marybeth (MB) Allen will present “Optimized Reflow Profiling to Minimize Voiding” during SMTA International. The presentation is scheduled to take place during the IPC Session ‘Lead-Free Symposium,’ Session LF2 on Thursday, Sept. 29, 2016 from 11 a.m.-12 p.m.

The presentation will address reflow challenges and solutions that the U.S. marketplace is currently facing, as well as into the future. Topics will include:

  • How to use your tools and those available to improve your reflow process

  • Faster setup, especially in a high-mix, low volume environment

  • Faster changeover for more uptime

  • Connectivity for MES and factory automation

  • Managing customers’ requirements

  • Continued process improvement and control

MB Allen is the Product Manager for KIC. As such she coordinates the advancement of new products and features to accommodate customer needs as KIC adds to its portfolio for the electronics and solar industries. Her technical expertise, relationships with valued partners and customers, and many years of sales experience aid KIC in the future development, improvement and sales of the company's product offerings. MB has worked in the electronics industry for 27 years and been associated with KIC for 25 years. She was been working as KIC's General Manager in Europe for six years and previously was KIC's North American Sales Manager.


Based in San Diego, KIC is the industry leader in automated thermal process tools and systems for reflow, wave, curing and semiconductor thermal processes. The company pioneered the development of oven profilers and process optimization tools, and then worked to create the next generation of thermal systems to help manufacturers improve the thermal process quality while reducing cost.

KIC products include the KIC K2, X5, KICstart2, ProBot, 24/7 Wave, KIC RPI and KIC Footprint. With the introduction of cutting-edge tools, the company continues to stay on the leading edge of process optimization and automatic thermal process systems, and has won numerous industry awards.For more information, visit www.kicthermal.com.

Aug 16, 2017 -

ViTrox and KIC Establish Cooperation and Connectivity

Aug 15, 2017 -

Move up the SMART FACTORY Learning Curve with KIC at SMTA International

Aug 03, 2017 -

Carlos Espinoza Promoted to Operations Manager for KIC

Jul 26, 2017 -

KIC Appoints Accomplished Engineering Manager

Jul 25, 2017 -

Making Ovens Smarter – Visit KIC at NEPCON South China

Jul 12, 2017 -

KIC Honors Bjorn Dahle for 20 Years of Innovating Thermal Process Tools

Jul 10, 2017 -

Larry Fey Joins KIC as Principal Electrical Engineer

Jun 13, 2017 -

Move toward the future of line connectivity, flexible production, process transparency, machine learning and real-time insight

Jun 01, 2017 -

Turn Your Factory into a SMART FACTORY – Meet with KIC’s MB Allen at the SMTA Upper Midwest Expo

May 03, 2017 -

KIC’s MB Allen to Discuss Thermal Process Data Collection at SMTA Michigan

176 more news from KIC Thermal »

Aug 16, 2017 -

Inovaxe Is Making Storage SMARTER – Visit Booth #915 at SMTAI

Aug 16, 2017 -

COT Increases Manufacturing Capability with New DMG Horizontal Milling Centers

Aug 16, 2017 -

High-Performance 3D AOI from Viscom at SMTAI

Aug 16, 2017 -

Innovative Bench-top Soldering Equipment from Metcal at SMTAI

Aug 16, 2017 -

ADLINK Introduces MVP-6010/6020 Series of Expandable Fanless Embedded Computers with Four Expansion Slots

Aug 16, 2017 -

SMTA Capital Expo to Feature Essemtec Fox Pick and Place System

Aug 16, 2017 -

All-in-One Low-cost, Scalable Functional test, In-System Programming, Boundary Scan / JTAG, In-Circuit Test System from Acculogic Visit Booth #133 at SMTA International

Aug 16, 2017 -

PDR’s New IR Thermal Test System Thermally Cycles Key Critical Components to Detect Defects

Aug 16, 2017 -

Automated X-ray Inspection with Component Counting from Scienscope at SMTAI

Aug 15, 2017 -

Nordson Brings Its Flagship Inspection Systems to SMTAI

See electronics manufacturing industry news »

KIC’s MB Allen to Present ‘Optimized Reflow Profiling to Minimize Voiding’ during SMTAI news release has been viewed 429 times

  • SMTnet
  • »
  • Industry News
  • »
  • KIC’s MB Allen to Present ‘Optimized Reflow Profiling to Minimize Voiding’ during SMTAI
Reflow Oven

reflow oven profiler