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  • “Test Plan Development – How to Do It!” to Be Presented by Dr. Gil Sharon on April 12th SMTA Capital Chapter Meeting at DfR Solutions

“Test Plan Development – How to Do It!” to Be Presented by Dr. Gil Sharon on April 12th SMTA Capital Chapter Meeting at DfR Solutions

Mar 31, 2016

Dr. Gil Sharon is a Senior Application Engineer at DfR Solutions.

Dr. Gil Sharon is a Senior Application Engineer at DfR Solutions.

The SMTA Capital Chapter is pleased to announce its first meeting of 2016 on April 12th, scheduled from 5:00 pm to 7:00 pm at DfR Solutions, 9000 Virginia Manor Road, Suite 290, Beltsville, MD 20705. The focus of this chapter meeting will be “Test Plan Development – How to Do It!” presented by Dr. Gil Sharon, DfR Solutions.

Testing (a.k.a. environmental testing, accelerated life testing, design verification, product validation, etc.) is considered the default method for ensuring quality and reliability before product launch. This is especially true for small to medium enterprises (SME) or those organizations that rely on an original design manufacturer (ODM) model. And yet, the establishment of a test plan, with the appropriate sequencing (what test should be in series? what should be in parallel? what should be combinatorial?) and test parameters, is often crafted through a combination of gut feel, prior experience, and a cursory review of industry standards. This approach, while understandable, can often lead to confusion and delay when failures occur. And without a clear delineation to the field environment, test success may not mean field success at the customer level.

In this presentation, Dr. Sharon will provide a clear and concise process for developing test plans for electronic products and systems. The presentation will walk through the best practices in test plan development, which includes:

  • Developing a Customer Persona
  • Capturing all Environmental Stressors

  • Defining Limits (95th percentile? 99th percentile?)

  • Identifying Synergistic Effects

  • Incorporating Physics of Failure

  • Determining Sample Size

  • Case Studies

Dr. Gil Sharon is a Senior Application Engineer at DfR Solutions. Dr. Sharon’s research focus is on mechanical reliability of electronic systems and components, multidisciplinary reliability of complex electro mechanical systems, characterization and modeling of material behavior, physics of failure of electromechanical and MEMS systems, and mechanical performance of flip chip packages. His doctoral research included solder reliability, MEMS structures characterization, embedded components failure analysis, and particle beam accelerator mechanical fatigue. Dr. Sharon’s experience at Amkor Technology included analysis of chip-package interactions and senior engineer in the advanced product development group. Dr. Sharon received his Ph.D. in Mechanical Engineering at the University of Maryland.

The evening is scheduled as follows:

5:00-5:30 pm Registration, Networking and Dinner

5:30-6:30 pm Presentation: “Test Plan Development – How to Do It!” presented by Dr. Gil Sharon

6:30-7:00 pm Facility Tour

Location:

DfR Solutions

9000 Virginia Manor Road

Suite 290

Beltsville, MD 20705

(301) 640-5812
 

Please join us for this networking, learning and dinner event. The registration fees are $20 for members and $30 for non-members. Any new member that joins the chapter at this event can attend the next chapter meeting for FREE.

To RSVP, please click on the following link:http://www.smta.org/chapters/rsvp.cfm?BEE_ID=3809.

All non-US citizens attending must complete a Foreign Visitor Request form and email it to Tom O’Conner at toconnor@dfrsolutions.com by April 1st.


The SMTA membership is an international network of professionals who build skills, share practical experience and develop solutions in electronic assembly technologies, including microsystems, emerging technologies, and related business operations. For more information or to join, please visit www.smta.org.

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