SMT, PCB Electronics Industry News

SMT, PCB Electronics Industry News

News from Machine Vision Products, Inc


Machine Vision Products to demonstrate multiple AOI sensor technologies and advanced software products at IPC APEX EXPO 2016

Mar 11, 2016

MVP GEM III

MVP GEM III

Machine Vision Products to demonstrate multiple AOI sensor technologies and advanced software products at IPC APEX EXPO 2016

Carlsbad, CA – March 11, 2016. Machine Vision Products (MVP), a leader in Automated Optical Inspection will be demonstrating Portable AOI, 3D AOI and advanced software products at IPC APEX EXPO 2016 in the Las Vegas Convention Center from March 15 to 17. MVP is exhibiting at Booth #2100.

MVP is a recognized leader in AOI technology with a wide range of advanced solutions delivered for SMT, Microelectronics and Packaging customers. MVP continues to base their operations for innovative design, development and manufacturing in Carlsbad, California at their Corporate Headquarters. All of MVP’s systems are made in the USA.

MVP continues to introduce advanced AOI solutions and IPC Apex Expo 2016 will see MVP demonstrate the latest of their technologies for Portable AOI, 3D AOI and advanced software solutions.

Multiple Sensor Technologies

MVP is demonstrating it’s true flexibility across all its range of SMT and Microelectronics AOI products. All MVP AOI solutions are capable of hosting different sensor technologies based on a customer’s inspection criteria.

At IPC Apex 2016 MVP’s AOI solutions will demonstrate 12MP AOI cameras capable to 01005 inspection; 3D AOI for complex device inspection and 3D laser technology for Paste Inspection. All of MVP’s sensor resolutions are scalable from 10um to 1.5um for SMT and Microelectronics.

Faster Inspection Times

MVP will be demonstrating high-speed 12MP AOI sensor capability at IPC APEX. With a superior frame rate, the 12MP technology yields a pixel resolution between 1.5 – 10 microns per pixel. Coupled with flying acquisition these superior inspection capabilities deliver speed increases of 30 to 40%.

MVP’s range of SMT solutions are defined by their high performance and high speed capabilities. With the introduction of new higher resolution color camera technology MVP enhance their product range with even higher speed inspection capabilities while maintaining their robust high performance for defect detection while driving false calls to zero.

Introducing the GEM III Platform

The GEM III AOI is a feature rich, highly robust, yet portable AOI platform based on Machine Vision Product’s existing high performance AOI solutions. The GEM III incorporates an 8MP camera and is fully certified for 01005 inspection with an 8 micron pixel size.

The GEM III features MVP’s wizard driven ease-of-use database programming ePro and the Auto-Optimize wizard and is a cost effective, yet powerful solution for low volume, high mix production environments including New Product Introduction. By utilizing the same optics as inline AOI new inspection programs are equally portable between the GEM III and MVP’s range of inline solutions.

3D AOI

MVP will be demonstrating 3D AOI configured for a Portable Platform on the GEM III at IPC APEX 2016.

The MVP approach to 3D AOI utilizes the combination of both 2D and 3D AOI technologies bringing the advantages of high speed and superior defect coverage for complex defects. MVP’s advanced software tools are the key to taking advantage of each of the sensors. Combined with MVP’s ease of use software utilities ePro and Validate, it is now possible to attain the highest levels of defect coverage with MVP’s latest suite of inspection utilities.

The advanced 3D is truly flexible allowing users to select to use 3D on specific component types or individual reference designators, while maintaining traditional high speed operation.

MVP recently introduced a new User Defined Defect (UDD) capability linking specific failure modes to specific user defect definitions. In qualified processes the UDD can be used to allow automatic defect assignment without the requirement to review individual defects. MVP will demonstrate the powerful new feature with the GEM III.

SPI

For customers interested in SPI, MVP will be demonstrating their advanced Solder Paste Inspection technology with enhanced ease of use utilities allowing users to create robust 3D SPI inspection databases in a matter of minutes.

Traceability Products and Image Archiving

MVP is also a provider of software solutions that extend the power of our AOI technologies to provide advanced traceability options for our customers.

MVP will be demonstrating its AutoNetworker, a centralized database with the flexibility to be configured for a host of data mining options. For SMT and Microelectronics, both measurement and pass/fail data can be stored for every product, from every lot or work order and scalable dependent on the customer’s requirements.  Data can be retained based on a customer’s own requirements from short term to endless data collection.

AutoNetworker is a valuable tool designed with the ability to quickly create reports for quality managers, operation managers and process engineers via a web-based interface accessible from any intranet location.

A significant new development to be demonstrated by MVP is the new Image Archiving capability of the AutoNetworker. Providing the ability to save every defect image detected by multiple AOI machines MVP now provide a scalable solution for Image Archiving, For critical processes where quality is of critical nature the ability to provide visual traceability as well as data traceability is essential. MVP now delivers that capability.

MVP will also be demonstrating their Dynamic Process Control (DPC) product that provides effective process traceability, linking assembly defects to the respective source equipment to provide fast resolution. DPC is scalable with lite options from AOI Management, to Production Line Management to full Factory Shop Floor Control. Full DPC includes Material Management, WIP Management, Feeder Management and Set Up Management amongst the many tools available.

Discover MVP’s Microelectronics Applications

MVP’s expert team will be available to discuss solutions for the MVP 850G platform for Microelectronics applications during the IPC APEX EXPO. The 850G supports the widest range of microelectronics applications due to MVP’s advanced toolbox of solutions. With resolution and repeatability a critical factor, the 850G can be configured to a 1um pixel size.

For hybrid electronic production MVP is in a unique position to offer both Microelectronics and SMT solutions for the same assembly using the 850G platform.

For additional information on MVP, please visit us at www.machinevisionproducts.com or visit us at booth number 2100 at IPC APEX EXPO where we can discuss your application requirements.

For further information contact:

Email: sales@visionpro.com

Phone: 1-800-260-4MVP or +1-760-438-1138

About Machine Vision Products, Inc.

Machine Vision Products is a market innovator and leader in imaging technologies for Surface Mount, Microelectronics and Packaging Technologies. Machine Vision Products provide solutions for both commercial and military applications. Machine Vision Products operate globally with direct operations in the US, China, Malaysia and the UK, with additional representation in countries throughout North America, Europe and Asia.

www.machinevisionproducts.com

You must be a registered user to talk back to us.

More News from Machine Vision Products, Inc

Jul 08, 2016 -

Machine Vision Products to Demonstrate Diverse Microelectronics and Packaging Inspection Toolbox of its Microelectronics AOI Platforms at Semicon West 2016

Apr 06, 2016 -

Machine Vision Products, Inc. announces New Website Launch

Mar 11, 2016 -

Machine Vision Products to demonstrate multiple AOI sensor technologies and advanced software products at IPC APEX EXPO 2016

Nov 04, 2015 -

Machine Vision Products Demonstrates Diverse Inspection Toolbox for 3D AOI, Microelectronics and Packaging on the MVP 850 Platform AOI at Productronica

Jul 10, 2015 -

Machine Vision Products to Demonstrate Diverse Microelectronics and Packaging Inspection Toolbox of its MVP 850 AOI Platform for at Semicon West 2015

Apr 24, 2015 -

Machine Vision Products receives a 9th SMT China Vision Award at Nepcon China

Feb 20, 2015 -

Machine Vision Products to demo 3D AOI and advanced software products at IPC APEX EXPO 2015

Feb 20, 2015 -

Machine Vision Products wins the Delphi China Appreciation Award

Jul 03, 2014 -

Machine Vision Products Demonstrates Diverse Inspection Toolbox for Microelectronics and Packaging on the MVP 850G platform AOI at Semicon West 2014

Apr 28, 2014 -

Machine Vision Products receive two SMT China Vision Awards at Nepcon China

(65) more news from Machine Vision Products, Inc

Machine Vision Products to demonstrate multiple AOI sensor technologies and advanced software products at IPC APEX EXPO 2016 news release has been viewed 304 times

PCB equipment

reflow oven profiler