FS Inspection will exhibit its complete series of high magnification visual inspection systems in in Booth #516 at AmCon Seattle, scheduled to take place Feb. 16-17, 2016 at the Meydenbauer Center in Bellevue, WA. Company representatives will demonstrate the VERSAMag™, ergonomically designed to reduce operator strain, resulting in increased accuracy and improved productivity.
FS Inspection’s high-definition systems are a more cost-effective, operator-supportive solution than traditional microscopes. They can be used in multiple industries and departments, including consumer and industrial electronics, mechanical parts, automotive, forensics, medical, micro-assembly, micro-repair, and quality control. FS Inspection’s newest high-definition inspection system combines real-time magnification, flexible positioning and measurement and image processing capabilities.
The FS Inspection series also includes the HDMag® High-Definition Inspection Station, X-Mag™ High-Magnification Workstation and PKMag® 50 Portable Visual Inspection Device. For more information, visit www.fsinspection.com.
FS Inspection produces advanced, accurate, and affordable high-magnification visual inspection systems. These systems are developed specifically for the industrial inspection market. Each system is designed with state-of-the-art technology to fit the advancing needs of the microscopic inspection industry. Each HD system has been created for ease of use and are ergonomically designed to reduce operator strain; resulting in increased operator accuracy and improved productivity. FS Inspection’s visual inspection systems are a more cost-effective, operator supportive solution than traditional microscopes. Our versatile inspection systems can be used in multiple industries, including but not limited to consumer & industrial electronics, mechanical parts, automotive, forensics, medical, micro-assembly, micro-repair, and other quality control tasks. FS Inspection is a division of Freedom Scientific. For more information, visit www.fsinspection.com.