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MIRTEC AND YXLON RECEIVE JOINT GLOBAL TECHNOLOGY AWARD FOR THE NEW SMARTLOOP YIELD IMPROVEMENT SYSTEM

Nov 12, 2015

MIRTEC and YXLON jointly received a 2015 Global Technology Award in the category of Software – Production for the new SmartLoop yield improvement system. The award was presented to the companies during a ceremony on Tuesday, Nov. 10, 2015 that took place at the Messe München exhibition center in Munich, Germany during Productronica.

MIRTEC, together with YXLON, have delivered a game-changing yield improvement solution. SmartLoop links the in-line 3D AOI with the at-line 2D X-ray and the SmartLoop yield improvement system, allowing data to flow between them seamlessly. The at-line X-ray system now becomes a verification station for the 3D height measurements taken by the AOI system. 3D AOI can only measure differences in z-height on devices like BGAs and make a guestimate as to the quality of the joints underneath and the need for rework.

X-ray inspection time also is dramatically reduced by targeting only suspect parts that the system automatically selects for inspection. 3D AOI is now a much more meaningful tool, as combined with at-line X-ray it gives a result on BGA’s and other Bottom Terminated Devices, not just a height measurement! Full data integration gives the technician the tools needed for correct decisions, intelligent feedback and process improvements. Keith Bryant, SmartLoop Sales Director said, “Working with these two market-leading companies has ensured that SmartLoop was demonstrated to major global players in the shortest time and with the best possible results. This is a very strong team and will drive the success of SmartLoop to the mutual benefit of all concerned, including our customers.”

Premiering in 2005, the Global Technology Awards program is an annual celebration of product excellence in electronics surface mount assembly. Premier products based on the finest examples of creative advancement in technology are chosen by a distinguished panel of industry experts.


MIRTEC is a leading global supplier of automated inspection systems to the Electronics Manufacturing Industry. For further information, please visit www.mirtec.com.

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MIRTEC AND YXLON RECEIVE JOINT GLOBAL TECHNOLOGY AWARD FOR THE NEW SMARTLOOP YIELD IMPROVEMENT SYSTEM news release has been viewed 358 times

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