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  • Press Preview for IEEE AutotestCon 2015, National Harbor; Maryland, 3- 5 November 2015, Hall 403

Press Preview for IEEE AutotestCon 2015, National Harbor; Maryland, 3- 5 November 2015, Hall 403

Nov 01, 2015

JTAG Technologies Inside - The future of your ATE application with boundary-scan

The access to nodes of assemblies with ever increasing complexity is more and more difficult and results in reduced fault coverage. Test engineers worry about this daily.

JTAG Technologies’ motto for this AutotestCon year reads: Optimise your ATE with JTAG Technologies Inside — have a look at the possibilities that arise from the use of “JTAG TECHNOLOGIES INSIDE” and see your current test methods and possibilities from a different perspective. In our booth # 403 we will display the following highlights from our comprehensive ATE product portfolio:

  • ICT, MDA or flying probe systems are quickly and easily upgraded with JTAG Technologies’ boundary-scan solutions. Special add-on cards and software integration suites enable users to benefit from the features of the combined systems.
  • Traditional functional tests based on National Instruments’ LabView/TestStand, C++, .net and other programming languages often feature complex and time-consuming test programs. Easy access to your assembly via boundary-scan pins can simplify your existing test programs and ease diagnosis in case of faults.

Peter van den Eijnden, managing director of JTAG Technologies commented this year’s focus for the show: “Since many years we are cooperating with renowned ATE suppliers to make sure that our customers will continue to enjoy optimal use of their existing ICT/MDA/FPT/FCT systems throughout the coming years. In joint efforts with various test system manufacturers we developed special hardware and software solutions. These special solutions enable perfect integration of our tools into these test systems, so users benefit from advantages of the combination of both methods”.

Our link to the full article: http://www.jtag.com/de/content/productronica-2015


JTAG Technologies is a market leader and technology innovator of boundary-scan software and hardware products and services. The company was the first to bring to the market such important advances as automated test generation, automated fault coverage analysis, automated flash and PLD programming via boundary-scan, and visualized boundary-scan analysis. Its customers include world leaders in electronics design and manufacturing such as Ericsson, Flextronics, Honeywell, Medtronic, Motorola, Nokia, Philips, Raytheon, Rockwell-Collins, Samsung, and Sony. Its innovative boundary-scan products provide test preparation, test execution, test result analysis and in-system programming applications. With an installed base of over 8500 systems worldwide, JTAG Technologies serves the communications, medical electronics, avionics, defence, automotive, and consumer industries with offices throughout North America, Europe and Asia. JTAG Technologies headquarters are located in Eindhoven, The Netherlands. For more information please visit www.jtag.com

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Press Preview for IEEE AutotestCon 2015, National Harbor; Maryland, 3- 5 November 2015, Hall 403 news release has been viewed 761 times

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