SMT, PCB Electronics Industry News

SMT, PCB Electronics Industry News

News from Checksum, LLC


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  • CheckSum To Demonstrate New V12 In-Circuit Test Measurement Electronics Module And 12KN -Circuit Test on Tilt Probe Test Fixtures - at SMT Nuremberg, 5-7 April Nuremberg, Booth 7A-421

CheckSum To Demonstrate New V12 In-Circuit Test Measurement Electronics Module And 12KN -Circuit Test on Tilt Probe Test Fixtures - at SMT Nuremberg, 5-7 April Nuremberg, Booth 7A-421

Apr 28, 2015

The CheckSum Analyst ils has all the features of the Analyst ems, but in a package with an integrated high-speed board handler for use in an automated production and test line.

The CheckSum Analyst ils has all the features of the Analyst ems, but in a package with an integrated high-speed board handler for use in an automated production and test line.

Analyst ems In Circuit ICT Tester.

Analyst ems In Circuit ICT Tester.

The new CheckSum V12 Measurement Card will be exhibited amongst other products at the SMT Show Nuremberg, booth 7A-421. The V12 is the latest version of CheckSum electronics that controls and runs CheckSum’s range of in-circuit and functional testing systems. The V12 card will be demonstrated in CheckSum’s range of In-Circuit and Functional Testing Systems, CheckSum will have representatives available to showcase our latest technology.

The V12 uses lower voltage stimulus to safely test your PCB devices.

The V12 performs power-off in-circuit tests using test voltages as low as 50mV to protect delicate circuits from electrical overstress (EOS). This allows for testing IC’s and other sensitive devices without accidentally powering them up, thereby preventing possible component damage at ICT.

The V12 brings CheckSum into an exciting new phase for all of our in-circuit testers.

Manufacturers can now utilize a low-cost in-circuit tester that will provide a safer testing process for your PCBs by controlling the voltage applied to the new generation of chips that are placed on the PCBs. As semiconductor technology moves to lower and lower voltage, it is important for CheckSum to get out in front of the trend and provide a platform that can help customers dealing with aging ICT platforms that were designed long before people expected chips to run at such low voltages.

The newest version of the card decreases test times and increases throughput for ICT and FT measurements.

The V12 utilizes advanced digital signal processing to provide unprecedented test speed, resulting in decreased test times, along with the measurement stability CheckSum is known for. With the V12’s ability to decrease test times, manufacturers will get a more efficient test process with faster returns on CheckSum testers.

The combination of control, safety, reliability and faster production makes the V12 an important piece of technology in ICT.

The V12 is the new standard measurement card for Checksum in-circuit and functional test systems and can also be easily retrofitted to existing CheckSum test systems. The V12 is available in all CheckSum in-circuit testing systems and has been shipping since December of 2014.

Also in the Ramplight - Analyst ils In Circuit ICT Tester.

Designed for testing all types of circuit assemblies the CheckSum Analyst ils has all the features of the Analyst ems, but in a package with an integrated high-speed board handler for use in an automated production and test line. The CheckSum Analyst ils combines manufacturing process testing with TestJet Technology for high fault coverage in circuit test of a single assembly or a panel of multiple assemblies in minimum time with maximum fault coverage. Providing features such as periodic sampling of UUTs passing down the line and automated recompression of probes and/or automatic retesting on failures, the Analyst ils meets sophisticated testing needs.

The Analyst ils performs effective power-down testing for most analog or digital assemblies being manufactured today quickly and easily testing through-hole and SMT circuit board assemblies for common manufacturing defects such as incorrect, missing or misoriented components, and opens and shorts. Equipped standard with TestJet Technology, Analyst can identify opens in and around most analog and digital IC packages.

In-Circuit Test on Tilt Probe Test Fixtures
Flying Probe Alternative – the 12KN

This In-Circuit Test System is designed to test all types of circuit assemblies using Everett Charles Technologies Tilt Probe test fixture technology.

Applications

  • Ideal for New Product Introduction (NPI) and High-Mix / Low-Volume
  • Loaded Circuit Assemblies
  • Through-Hole and SM Assemblies
  • Single and Double-Sided Assemblies

Features

  • Everett Charles Technologies Tilt Probe Fixtures with 1-2 week fixture delivery
  • Fixture cost is 60% to 70% lower than traditional ICT, $2 per node + kit cost of $1000
  • Handles circuit boards up to 24 x 15 inches (60.96 x 38.1 cm)
  • Fixture Wiring is Eliminated
  • TestJet Technology
  • MultiWriter In-System Part Programming (ISP)
  • Bed-of-Nails Fixtures for Variable Height Requirements
  • Pin spacing down to 0.6mm (0.024 inch) pitch
  • Fine pitch targets down to 0.38mm (0.015 inch)
  • Fully Integrated CheckSum Test System Software Environment
  • System Configurations available with 2500 or 5000 test points

CheckSum is a leading supplier of in circuit test and on-board gang programming systems and services to the worldwide electronics manufacturing industry.  Products and services include systems, fixtures, and programs that detect manufacturing process faults on complex SMT printed circuit assemblies and that provide value-added operations such as device In-System, On-Board Part Programming.  With an installed base of almost 4,000 test systems at more than 200 manufacturing sites in over 40 countries, CheckSum helps customers ranging from automotive electronics manufacturers to global EMS providers increase productivity while reducing total test and manufacturing costs.  CheckSum is headquartered in Arlington, Washington.

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More News from Checksum, LLC

Apr 28, 2015 -

CheckSum To Demonstrate New V12 In-Circuit Test Measurement Electronics Module And 12KN -Circuit Test on Tilt Probe Test Fixtures - at SMT Nuremberg, 5-7 April Nuremberg, Booth 7A-421

Feb 17, 2015 -

CheckSum To Demonstrate New V12 In-Circuit Test Measurement Electronics Module at IPC APEX Expo

Nov 03, 2014 -

CheckSum To Unveil Latest Version of In-Circuit Test Measurement Electronics at Electronica Munich

Mar 31, 2014 -

New In-Circuit Tester Aimed at Replacing Flying Probers Demonstrated at APEX

CheckSum To Demonstrate New V12 In-Circuit Test Measurement Electronics Module And 12KN -Circuit Test on Tilt Probe Test Fixtures - at SMT Nuremberg, 5-7 April Nuremberg, Booth 7A-421 news release has been viewed 711 times

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  • CheckSum To Demonstrate New V12 In-Circuit Test Measurement Electronics Module And 12KN -Circuit Test on Tilt Probe Test Fixtures - at SMT Nuremberg, 5-7 April Nuremberg, Booth 7A-421
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