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News from Akrometrix

Akrometrix LLC’s CXP to Be Displayed at SMT/Hybrid/Packaging 2015

Apr 07, 2015

Akrometrix LLC’s CXP.

Akrometrix LLC’s CXP.

Akrometrix LLC, the leader in elevated temperature surface characterization, will display the latest surface measurement equipment platform, the CXP, in the Microtronic Booth, #7-101L, at SMT Hybrid Packaging, scheduled to take place May 5-7, 2015 at the Messe in Nuremberg Germany.

Microtronic GmbH, a leading sales specialist of microelectronics, now offers Akrometrix LLC’s CXP, powered by Studio Software. Akrometrix LLC is the leader in elevated temperature surface characterization. The CXP addresses EMS and PCB market needs for affordable surface characterization of PCB local areas under reflow conditions. The capabilities of the CXP tool make it a cost-effective solution for EMS and PCB companies to apply the new IPC 9641 standard, concerning warpage measurement of PCB surface mount regions.

For 20 years Akrometrix has supported the electronics Industry through services and products that measure the warpage of packages used in surface mount assemblies.  While this has been crucial for product yield and reliability, warpage of PCB land areas has typically not been fully understood. The recently finalized IPC 9641 industry standard brings to the forefront the need for warpage measurement to be performed on the PCB side of surface mount assemblies.  

Warpage results collected with the CXP from PCB land areas can be compared to corresponding component warpage through the use of the Akrometrix Interface Analysis software solution, which enables shape matching and interconnect gap analysis at critical temperatures throughout a reflow cycle.

The introduction of the CXP represents Akrometrix LLC’s continued commitment to developing solutions that meet and exceed customer requirements. The CXP is currently available for sale worldwide. For more information contact Microtronic at 

For more information, meet company representatives in Booth #7-101L at the show or visit

Akrometrix LLC, the leader in elevated temperature surface characterization,was founded in 1993 by Dr. Charles Ume, a Professor and Director of the Advanced Electronic Packaging and Laser Processing Laboratory, at the George W. Woodruff School of Mechanical Engineering, Georgia Institute of Technology, Atlanta, Georgia.  Headquartered in Atlanta, Akrometrix supports over 250 equipment installations worldwide.  For more information, contact Akrometrix at

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