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ACD to Present PoP Assembly and Functional Test Services at the IPC APEX EXPO

Jan 19, 2015

 ACD, a leading supplier to the electronics industry and leader in Package-on-Package (PoP) assembly, will exhibit in Booth #2338 at the IPC APEX EXPO, scheduled to take place Feb. 24-26, 2015 at the San Diego Convention Center in California. ACD’s assembly business model supports high-mix, high-technology assembly from prototypes through low-to-mid volume production.

With single- and double-sided flying probe testers, ACD offers its customers confidence in receiving quality, defect free assemblies. ACD’s functional testing verifies that each of the various product capabilities defined in the design specification or test specification meet customer requirements. This is instrumental to providing ACD’s customers with quality, defect free assemblies. ACD works closely with its customers and the Functional Test Department to develop an accurate test for each assembly.

With a focus on high-end technology, ACD is staffed with two shifts to respond to a variety of products, markets, and deliveries. ACD supports the printed circuit board (PCB) industry in a variety of ways; from design to laser photoplotting, to supporting engineering software, to final test. ACD offers the support required to get products to market as quickly as possible.

Now in its 30th year, ACD continues to streamline its process to ensure that customers receive a high quality product in a timeframe that meets or exceeds expectations. The company is AS9100C and ISO 13485 certified, and ITAR registered. For more information about ACD’s design and contract assembly services, meet with company representatives in Booth #2338 at the IPC APEX Expo or visit www.ACDUSA.com.


Founded in 1984, ACD is an AS9100 and ISO 13485 certified full service EMS company. The company’s services comprise complete board layout, DFM/DFA capability, printed circuit fabrication, component procurement, thru-hole, SMT and part-on-part mixed technology assembly, box build, rework, flying probe, functional and JTAG test, and development. For more information, visit www.ACDUSA.com.

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