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X-ray Inspection: High-Contrast|Detector Investigates Non-Conductive Die-Attach

Jun 05, 2001

The X-ray inspection of non-conductive die-attach has been not feasible using the customary real time image technique. This has changed now with the launch of the new high-contrast|detector by phoenix|x-ray.

At the first seminar on non-conductive die-attach inspection in Seoul / Korea the high-contrast|detector was demonstrated in a phoenix|x-ray inspection system. Mr. D. H. Yoon, sales director of Ahtech, and Mr. T. Mayer, phoenix|x-ray application manager for Asia, presented the latest results which were found to be a break-through in non-conductive die-attach inspection. The seminar was attended by representatives of the four biggest semiconductor companies in Korea.

The high-contrast|detector also provides unprecedented results in-specting other low absorbing objects or features of poor X-ray contrast. Some typical applications are prepreg voids, microvias, moulding voids and biological specimen. The device can be optionally integrated into each phoenix|x-ray system of the analyser series and into the pack-age|inspector, even as a supplement to existing installations.


phoenix|x-ray, a dynamic group of companies founded in 1999 is a leading manufacturer of microfocus and nanofocus X-ray systems, X-ray tubes and computed tomography systems. phoenix|x-ray world-wide supplies application oriented X-ray systems and complete customised inspection solutions for the electronics, semiconductor, automotive, aerospace and many other industries. The company puts high priority on customer service and large investments in the development of systems and software solutions in order to provide all-inclusive and versatile support to customers, establishing mutually beneficial, long-term partnerships.

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