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CyberOptics Brings the QX100™ to the TECHNO PLAZA OKAYA in Japan

Jul 19, 2013

CyberOptics Corporation (Nasdaq: CYBE) announces that it will display its award-winning QX100™ tabletop AOI system at a seminar scheduled to take place July 30, 2013 at the TECHNO PLAZA OKAYA in Japan.

The QX100™ AOI system combines the performance of an in-line inspection system with the flexibility of a tabletop system, redefining tabletop inspection for the industry. The system features CyberOptics’ unique image acquisition technology, the SIM, and is capable of inspecting component sizes down to 01005.

Powered by AI2 (Autonomous Image Interpretation), the QX100™ can detect defects effectively even with excessive variance and offers precise discrimination even when bad examples are added due to its high sensitivity to defects. With its true, one example inspection capability, users achieve excellent results from just one panel inspection – making it an ideal choice for high-mix, low volume environments. AI2 eliminates complicated model geometry definition and ranks examples in order so that unnecessary ones can be cleared quickly. Additionally, users can identify defects accurately and easily with its unique pixel marking feature. Inspection programs created on QX100™ can be directly transferred to CyberOptics’ in-line AOI systems (QX600, QX100i).

For more information, please visit www.cyberoptics.com.


Founded in 1984, CyberOptics is a recognized leader in AOI and SPI inspection solutions for the global electronics assembly and semiconductor capital equipment markets. Headquartered in Minneapolis, MN, CyberOptics conducts operations in North America, Singapore, China, Japan and Europe. For more information, visit the company’s Web site at www.cyberoptics.com.

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