SMT, PCB Electronics Industry News

SMT, PCB Electronics Industry News

News from CyberOptics Corporation

Experience CyberOptics’ Latest, Innovative SPI and AOI Inspection Solutions at IPC APEX EXPO

Jan 15, 2013

CyberOptics Corporation (Nasdaq: CYBE) will present its newest range of SPI and AOI inspection solutions in booth #1411 at the upcoming IPC APEX Expo, scheduled to take place February 19-21, 2013 at the San Diego Convention Center in California.

The QX600 AOI System comes with an all-new Strobed Inspection Module (SIM) with enhanced illumination using LED lighting. The new SIM significantly improves solder joint and gold finger inspection while dramatically reducing reflection and shadow effects. The SIM is engineered to be absolutely calibration-free and illuminates only when necessary, reducing cost of ownership. As illumination needs differ for various component types, we design our systems with flexible illumination providing a combination of lighting contrasts to suit different inspection types. A higher sensor resolution (12 µm) captures brilliant and crisp quality images for defect review analysis while improving 01005 inspection. Plus, we are still the fastest at a blazing inspection speed of 200cm2/sec.

The SE500ULTRA™ system is power-packed with 30% more speed, revamped defect review software and optional dual illumination sensor. An all-new, improved ultra-fast sensor combined with a unique ‘all-in-one’ scan technique (that integrates fiducial, barcode and range scans into one, seamless inspection scan sequence) is what makes the SE500ULTRA 30 percent faster at 210cm2/sec. The optional Dual Illumination sensor further enhances repeatability and reproducibility on the very smallest of paste deposits. The SE500ULTRA™ is closed loop feedback ready, which means, better yields too!

The QX100™ AOI system redefines tabletop inspection by combining the performance of an in-line inspection system with the flexibility of a tabletop system. The system features CyberOptics’ unique image acquisition technology, the SIM, and is capable of inspecting component sizes down to 01005.

The sleek QX100™ is powered by AI2 (Autonomous Image Interpretation), a next-generation image analysis technique. With AI2, programming gets faster – with a dramatic 90 percent reduction in examples, and simpler – with full support for unsupervised and semi-automatic model training, helping you setup models effortlessly. Inspection programs created on QX100™ can be directly transferred to our in-line AOI systems (QX600, QX100i).

Also, on display is the QX100i entry-level AOI which makes an ideal inspection choice for an inline AOI system at tabletop pricing.

Perfectly complementing our great line-up of inspection products is CyberConnect™, your best tool for correlating defects between AOI and SPI systems. Integrated within our SPC software, this feature gets you all the “right” data and displays them in just the “right” way for effective defect traceability. Correlating helps you pin-point exactly what went wrong and take corrective action reducing rework costs and improving overall line yield. All this simply means quicker turnaround and enhanced product quality. 

The CyberOptics team looks forward to welcoming visitors at booth #1411 during the IPC APEX EXPO.
For more information, please visit

Founded in 1984, CyberOptics is a recognized leader in AOI and SPI inspection solutions for the global electronics assembly and semiconductor capital equipment markets. Headquartered in Minneapolis, MN, CyberOptics conducts operations in North America, Singapore, China, Japan and Europe. For more information, visit the company’s Web site at


You must be a registered user to talk back to us.

More News from CyberOptics Corporation

Sep 28, 2016 -

CyberOptics Wins the Global Technology Award for AOI

Aug 24, 2016 -

Maximize Yields with MRS-Enabled SQ3000 3D AOI Featured at SMTAI

Aug 22, 2016 -

CyberOptics’ 3D SPI Offers Unsurpassed Price-Performance Advantages – Get a Live Demo at productronica India

Aug 17, 2016 -

CyberOptics Showcases Large Particle Sensing Functionality in Next-Generation Airborne Particle Sensors at SEMICON Taiwan

Aug 17, 2016 -

Laser Design Demonstrates Unique CyberGage360 3D Scanning Inspection System at 2016 International Manufacturing Technology Show

Jul 26, 2016 -

Learn How CyberOptics’ 3D AOI Maximizes ROI and Line Utilization at NEPCON South China

Jun 28, 2016 -

CyberOptics Introduces Large Particle Sensing Functionality in Next-Generation WaferSense and ReticleSense Airborne Particle Sensors

Mar 30, 2016 -

CyberOptics to Demonstrate Award-Winning Technology at SMT/Hybrid/Packaging

Mar 27, 2016 -

CyberOptics Will Demonstrate How Its 3D AOI Maximizes ROI and Line Utilization at NEPCON China

Mar 12, 2016 -

CyberOptics Debuts CyberGage360 3D Scanning System at APEX

(132) more news from CyberOptics Corporation

Experience CyberOptics’ Latest, Innovative SPI and AOI Inspection Solutions at IPC APEX EXPO news release has been viewed 719 times

Boundary Scan