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CyberOptics to Exhibit a Lineup of In-Line AOI and Advanced SPI Systems at JISSO PROTEC

May 25, 2012

CyberOptics QX100

CyberOptics QX100

CyberOptics QX500

CyberOptics QX500

CyberOptics Corporation (Nasdaq: CYBE) will introduce the QX100™ – AOI Tabletop System equipped with AI2 next-generation image analysis software, alongside a range of in-line AOI and SPI systems in Booth 4G-10 at the JISSO PROTEC 2012 exhibition, scheduled to take place June 13-15, 2012 at the Tokyo Big Sight in Japan. Also on display will be a prototype version of the QX100i™ system – an entry-level inline AOI system aimed at providing a cost-effective inspection solution.

The QX100™ redefines tabletop inspection by combining the performance of an in-line inspection system with the flexibility of a tabletop system. The system features CyberOptics’ unique image acquisition technology, the Strobed Inspection Module (SIM) and is capable of inspecting component sizes down to 01005.

The sleek QX100™ is powered by AI2 (Autonomous Image Interpretation), a patented next-generation image analysis technique evolved from CyberOptics’ industry-proven SAM technology, and takes advantage of the latest advances in processor architecture. AI2 is a robust statistical modeling engine that provides superior defect detection capabilities, the lowest false call rates and improved clarity of defect identification through an Active Pixel Marking feature.

With AI2 technology, programming gets faster – with a dramatic 90 percent reduction in examples — and simpler – with full support for unsupervised and semiautomatic model training — helping users set up models effortlessly. A single workflow setup makes the QX100™ an ideal choice for high-mix environments with the capability to adapt seamlessly to low-mix, high-volume production modes. Also, inspection programs created on the QX100 can be directly transferred to CyberOptics’ in-line AOI systems (QX500, QX100i) as customer production needs change.   

CyberOptics will showcase its flagship 3-D SPI system, the SE500™. Designed to inspect the most demanding assemblies at >80 cm²/sec inspection speed without compromising measurement accuracy and repeatability. The SE500™ system now offers a Dual Illumination sensor option to further improve repeatability and reproducibility on the very smallest of paste deposits.

CyberOptics also will display its multi-award winning QX500™ AOI system, which is truly innovative in every sense with a unique image acquisition solution – Strobed Inspection Module (SIM), designed to deliver high-speed inspection matched with exceptional defect coverage and an extremely low false call rate. Winning its third prestigious award since its launch at NEPCON China 2010 speaks volumes about the global recognition that QX500™ has gained in terms of its technological advancements and superior inspection capability. 

The CyberOptics team looks forward to welcoming visitors at booth 4G-10 during the JISSO PROTEC exhibition.
For more information, please visit www.cyberoptics.com.


About CyberOptics Corporation
Founded in 1984, CyberOptics is a recognized leader in process yield and throughput improvement solutions for the global electronics assembly and semiconductor capital equipment markets. Headquartered in Minneapolis, MN, CyberOptics conducts operations in North America, Asia and Europe. For more information, visit the company’s Web site at www.cyberoptics.com.

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