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  • Preview for the print media for Seica Inc for the Nepcon Shanghai show, April 25th to 27th, booth 1H70

Preview for the print media for Seica Inc for the Nepcon Shanghai show, April 25th to 27th, booth 1H70

Mar 30, 2012

Seica China will be an exhibitor at the Nepcon Shanghai being held on April 25th to 27th. The featured systems in booth # 1 H70 will include the Pilot V8 Flying Prober and the RTE-200 System.


Pilot Flying Probe Test Systems
PILOT  is the most versatile and complete line of automated flying probe test systems on the market today, offering the widest range of solutions and performances for flying probe test of electronic boards. At the show we will feature the systems below:


Pilot V8
The Pilot V8 is an innovative technology that offers maximum performance in regards to high test speed, test coverage and flexibility.  The system’s vertical architecture is the optimum solution for probing both sides of the UUT simultaneously.  This feature guarantees fast, precise, reliable and repeatable probing; it also allows for full availability of all the mobile resources for testing the UUT.

The Pilot V8 is equipped with 8 electrical flying test probes (4 on each side), 2 Openfix flying probes (1 on each side), 2 CCD cameras (1 on each side), and 2 power probes (1 on each side) for a total of 14 mobile resources available to test the UUT.  The mobile power probes enable power up of the UUT without requiring any additional fixed cables, allowing easy implementation of functional test.

The test tools and techniques of the Pilot V8 include:

FNODE signature analysis on the nets of the UUT
Standard analog and digital in-circuit test
Vectorless tests (JSCAN and OPENFIX), to test ICs for opens and shorts
PWMON net analysis for power on the boards
Continuity test to detect open tracks on the PCB
Visual tests for component presence/absence and rotation
Optional functional test and boundary scan test capabilities
On Board Programming tools for digital devices
Optional Thermal Scan resources

 

RTE-200 Functional Test Solution
The RTE-200 system is  an interesting functional test solution, equipped with analog, digital and boundary scan measurement capabilities, all integrated in a very small enclosure characterized by high portability and readiness for rack-style assembly in more complex systems.



About Seica:
Seica S.p.A, founded in 1986, is a global supplier of automatic test equipment and selective soldering systems, with an installed base of more than 1000 systems on four different continents.  Seica offers completely automated, laser-based selective soldering solutions, as well as a complete line of test solutions, which include bed of nails and flying probe testers; these have the ability to perform manufacturing defect analysis, in-circuit tests, functional tests and optical tests of loaded boards, second and third level electronic modules and printed circuit boards. Seica S.p.A corporate headquarters is located in Italy, with subsidiary in France, Germany, USA, and China, along with a worldwide distribution network.

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