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MEMS Test and Calibration: Multitest ships first InPhone system for high parallel microphone test

Sep 19, 2011

Combined with the Multitest InStrip® handler, the InPhone system is dedicated to high parallel MEMS test and the calibration of MEMS microphones.

Combined with the Multitest InStrip® handler, the InPhone system is dedicated to high parallel MEMS test and the calibration of MEMS microphones.

Multitest, a designer and manufacturer of final test handlers, contactors and load boards used by integrated device manufacturers (IDMs) and final test subcontractors worldwide, has shipped the first InPhone system to a European site of a major IDM. Combined with the Multitest InStrip® handler, the InPhone system is dedicated to high parallel MEMS test and the calibration of MEMS microphones. The InStrip® has been configured for InCarrier® test. Thus, singulated MEMS packages can be tested with the high parallelism of the InStrip® handler.

Microphone MEMS devices are becoming increasingly more important for state-of-the-art mobile communication applications. These applications require an expanded linear frequency range and generally need small packages, but at the same time they are very cost sensitive.

Multitest’s InPhone solution is based on an agitation in a pressure chamber that ensures homogenous acoustic stimuli across all parallel tested packages. The InCarrier® concept supports stable high-parallel test even for small packages. Therefore, this setup provides unique performance and cost-of-test advantages.


Multitest (headquartered in Rosenheim, Germany) is one of the world’s leading manufacturers of test equipment for semiconductors. Multitest markets test handlers, contactors, and ATE printed circuit boards. Globally, more than 700 employees serve the company’s customers in offices and branches in North America, Singapore, Malaysia, the Philippines, Taiwan, China and Thailand.

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