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Multitest's Dura® Kelvin Reduces Overall Cost of Test

Jul 06, 2011

Multiest, a designer and manufacturer of final test handlers, contactors and load boards used by integrated device manufacturers (IDMs) and final test subcontractors worldwide, announces that its Dura®Kelvin contactors again have proven their reputation for outstanding lifetime and cleaning cycles. At an international IDM’s high-volume production site, the Dura®Kelvin contactor substantially contributed to reducing the overall cost of test.

In this project lifespan, first pass yield and cleaning frequency were monitored. The Dura®Kelvin exceeded all targets significantly and the achieved life span of more than 4 mio insertions was more than four times the set target. First pass yield was improved from 95 -98.5 percent. The most amazing achievement is related to the cleaning frequency.

Dura®Kelvin only requires cleaning after approximately 100 hours. This reduces cleaning-related test cell downtime by 90 percent compared to the original test cell configuration. It also has a crucial impact, especially for cold test.

All of this leading-edge performance provides a unique cost of test advantage to the IDM.


Multitest (headquartered in Rosenheim, Germany) is one of the world’s leading manufacturers of test equipment for semiconductors. Multitest markets test handlers, contactors, and ATE printed circuit boards. Globally, more than 700 employees serve the company’s customers in offices and branches in North America, Singapore, Malaysia, the Philippines, Taiwan, China and Thailand.

 

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