SMT, PCB Electronics Industry News

Multitest's Dura® Kelvin Reduces Overall Cost of Test

Jul 06, 2011

Multiest, a designer and manufacturer of final test handlers, contactors and load boards used by integrated device manufacturers (IDMs) and final test subcontractors worldwide, announces that its Dura®Kelvin contactors again have proven their reputation for outstanding lifetime and cleaning cycles. At an international IDM’s high-volume production site, the Dura®Kelvin contactor substantially contributed to reducing the overall cost of test.

In this project lifespan, first pass yield and cleaning frequency were monitored. The Dura®Kelvin exceeded all targets significantly and the achieved life span of more than 4 mio insertions was more than four times the set target. First pass yield was improved from 95 -98.5 percent. The most amazing achievement is related to the cleaning frequency.

Dura®Kelvin only requires cleaning after approximately 100 hours. This reduces cleaning-related test cell downtime by 90 percent compared to the original test cell configuration. It also has a crucial impact, especially for cold test.

All of this leading-edge performance provides a unique cost of test advantage to the IDM.


Multitest (headquartered in Rosenheim, Germany) is one of the world’s leading manufacturers of test equipment for semiconductors. Multitest markets test handlers, contactors, and ATE printed circuit boards. Globally, more than 700 employees serve the company’s customers in offices and branches in North America, Singapore, Malaysia, the Philippines, Taiwan, China and Thailand.

 

Dec 16, 2013 -

Meet the Multitest Experts at the EUROPEAN 3D TSV SUMMIT

Dec 02, 2013 -

Profitable Innovation Requires Reliable Equipment Google Chromecast IC is tested on Multitest’s proven MT9928 Gravity Test Handler

Nov 25, 2013 -

Innovative Sensors Require Advanced Test Equipment Multitest ships first MEMS tri-temp solution for 3+2 axis magnetic test and calibration

Nov 18, 2013 -

25 Percent Cost of Test Improvement – Mercury Contactor Outperforms Competition

Nov 11, 2013 -

MT2168 – Successful Evaluation Proves Superior Performance Multitest’s innovative architecture ensures best results

Sep 09, 2013 -

Beyond Plug & Yield® - Multitest is acquired by LTX-Credence Bringing Tester, Handlers and Interfaces together

Aug 22, 2013 -

Multitest MT9510 Pick-and-Place Handler Meets the Requirements of ICs for Connectivity and Cloud Servers

Jul 15, 2013 -

Mobility Drives Electronics: Multitest’s Solutions for Efficient Test

Jul 01, 2013 -

Chat with Multitest’s Experts at SEMI TechHub – The New SEMICON West Format

Jun 25, 2013 -

Multitest at Test Vision 2020: Minimize Cost of Calibration and Test for Sensors

122 more news from Multitest Elektronische Systeme GmbH »

Jun 22, 2017 -

PNC Inc. Invests in LED Laser Direct Imaging system from Miva Technologies

Jun 22, 2017 -

Addressing The Modulation of Light Output -- High Quality LED Manufacturing

Jun 22, 2017 -

Schleuniger, Inc. Receives 2017 Best of Manchester Award

Jun 21, 2017 -

Inovar Inc. Breaks Ground for New Facility on USU Innovation Campus

Jun 21, 2017 -

PNC Inc. Launches Design Webinar Series

Jun 21, 2017 -

Saelig Introduces Mercury™ T2C USB 2.0 & Power Delivery Protocol Analyzer With Type-C Connection

Jun 20, 2017 -

Europlacer Secures Fourth Award from Industry Analysts Frost & Sullivan.

Jun 20, 2017 -

In Memory of Jim D. Raby, PE

Jun 20, 2017 -

Micro-Focused IR Thermal Testing with PDR's Focused IR

Jun 20, 2017 -

SCS to Present ‘Using Conformal Coatings to Mitigate System Failures’ during upcoming Webinar

See electronics manufacturing industry news »

Multitest's Dura® Kelvin Reduces Overall Cost of Test news release has been viewed 812 times

Precision Auger Dispense Pump

SMT Equipment Service