News Releases from Agilent Technologies, Inc.
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96 news releases added by Agilent Technologies, Inc.
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Agilent Technologies' DCA-J Firmware Update Runs MATLAB(r) Scripts, Directly Calculates Performance Parameters
Feb 28, 2008 | Agilent Technologies Inc. (NYSE: A) today introduced a firmware update for its 86100C DCA-J that allows R&D engineers to run MATLAB(r) scripts and directly calculate Transmitter Waveform Dispersion Penalty and other performance parameters without external processing.
Agilent Technologies Introduces Oscilloscopes with Industry's Biggest Display, Fastest Waveform Update Rate
Feb 28, 2008 | Agilent Technologies Inc. (NYSE: A) today expanded its mixed-signal and digital-storage oscilloscope portfolio with 10 new models that comprise its next-generation InfiniiVision 7000 Series. The new Agilent InfiniiVision 7000 Series offers bandwidths up to 1 GHz and delivers an unparalleled deep memory waveform update rate of up to 100,000 waveforms per second.
New Agilent Technologies Acqiris Digitizers Give Users More
Feb 22, 2008 | Agilent Technologies has introduced two new options for its compact, low-power (less than 15 W), high-speed Acqiris 8-bit PCI digitizer to give users more options depending on specific application and budget requirements.
Agilent Technologies to Release Boundary Scan-VTEP Hybrid that Minimizes Obstacles to In-Circuit Test
Feb 19, 2008 | Agilent Technologies Inc. (NYSE: A) today announced that it will offer in-circuit test (ICT) users an innovative way to test their printed circuit board assemblies (PCBAs) in a limited access environment without sacrificing test coverage or time-to-market -- while simultaneously saving on fixture cost and reducing test resources.
Agilent Technologies Introduces Serial Bus Triggering, Hardware-Based Decoding for 5000 Series Oscilloscopes, Providing Quick Troubleshooting at Affordable Price
Feb 11, 2008 | Agilent Technologies Inc. (NYSE: A) today introduced serial bus triggering and real-time decode support for its 5000 Series oscilloscopes.
Agilent Technologies Breaks the 1 Gpt Memory Barrier with New Infiniium High-Performance Real-Time Oscilloscopes
Feb 07, 2008 | Infiniium 90000A Series Provides Superior Signal Integrity, Deepest Application Analysis, Better Insight
Agilent Technologies' Automated X-Ray Inspection System Selected by Plexus for Rapid New-Product Testing
Feb 07, 2008 | Agilent Technologies Inc. (NYSE: A) and Plexus Corp. today announced that Plexus, a global electronic manufacturing services provider, has selected the Agilent Medalist x6000 Automated X-ray Inspection system as part of its test and inspection strategy for new products.
Test & Inspection solutions at Virtual PCB Tradeshow
Feb 03, 2008 | Agilent Technologies showcases latest Test & Inspection solutions at Virtual PCB Tradeshow
Agilent Technologies Introduces Precision Waveform Analyzer Providing Industry-Best Performance in Oscilloscope Solutions
Feb 03, 2008 | Agilent Technologies Inc. (NYSE: A) today introduced a precision waveform analyzer designed specifically for engineers involved in design verification and validation of high-speed electrical communications systems and components.
Agilent Technologies Announces Compact Microwave Analog Signal Generator with Fast Switching Speeds, Low Cost of Ownership
Feb 03, 2008 | Agilent Technologies Inc. (NYSE: A) today announced the availability of a compact microwave analog signal generator that delivers a low cost of ownership and is an extension to the popular Agilent MXG signal generator platform, providing frequency coverage to 20, 32 or 40 GHz.
Agilent Technologies Unveils Industry's First DDR2, DDR3 BGA Probe Solution for Oscilloscopes, Logic Analyzers
Jan 28, 2008 | Agilent Technologies Inc. (NYSE: A) today unveiled the industry's first DDR2 and DDR3 ball-grid array (BGA) probes for oscilloscopes and logic analyzers. The probes will be shown for the first time at DesignCon, here in Santa Clara, Feb. 4-6, 2008, Booth 305.
Agilent Technologies Announces Availability of Its First-Ever Transceiver Library for Signal Integrity Design EDA Solutions
Jan 28, 2008 | Library, Combined with Agilent's Advanced Design System, Reduces Development Costs and Increases Productivity for High-Speed Design
Agilent Technologies' DC Power Analyzer Wins Four Industry Awards
Jan 28, 2008 | Agilent Technologies Inc. (NYSE: A) today announced that its N6705A DC Power Analyzer has been awarded four prestigious industry awards:
Agilent Technologies Introduces Industry's First Pulse Function Arbitrary Noise Generator
Jan 28, 2008 | New Instrument Class Offers Most Accurate and Accelerated Insight into Devices and Designs, Enables Quantum Leap in Productivity
Agilent Technologies On-line Interactive Test & Measurement Catalog Now
Jan 23, 2008 | The new on-line interactive Agilent Test & Measurement Catalog 2008/09 is now available.
Agilent Technologies to Introduce First-to-Market 3GPP LTE Test Solutions at 2008 Mobile World Congress
Jan 14, 2008 | Agilent Technologies Inc. (NYSE: A) today announced that it will introduce new solutions for 3GPP Long Term Evolution (LTE) at the 2008 Mobile World Congress, Hall 1, Stand D45, Barcelona, Spain, Feb. 11-14. Agilent will show its newest LTE test products, including the first-to-market LTE UE development test platform with real-time protocol development tools created in partnership with Anite plc.
Agilent Technologies, ETS-Lindgren Test Equipment Selected by AT4 wireless for use in First Test Facility for WiMAX(tm) Radiated Performance Test
Jan 14, 2008 | Agilent Technologies (NYSE: A) and ETS-Lindgren today announced that they were selected by AT4 wireless labs to provide WiMAX test equipment for use in radiated performance test (RPT). AT4 wireless is one of the first test labs that is providing radiated performance testing for WiMAX.
Agilent Technologies' Broadband Digitizers Now Supported by 89600 Series Vector Signal Analysis Software
Jan 14, 2008 | Agilent Technologies Inc. (NYSE: A) today announced that it has upgraded its popular 89600 Series Vector Signal Analysis Software (VSA) to interface with its Acqiris 10-bit and 12-bit CompactPCI broadband digitizers, enabling significantly increased data-measurement accuracy.
Agilent Launches Series of Application Notes on Using Linux in Test Systems
Dec 17, 2007 | Agilent's test-system experts have released a free, multi-part series of application notes designed to explain how to control your test instruments using Linux.
High-Capacity Circuit Simulator, Combined with Additional Data Display, Electromagnetic Analysis and System-Level Design Tools Help Speed High-Frequency RFICs to Market
Dec 13, 2007 | Agilent Technologies Inc. (NYSE: A) today announced the availability of GoldenGate Plus for RFIC simulation, analysis and verification. Agilent's GoldenGate Plus product line speeds the design of large-scale RFICs for wireless communication products.
Agilent Technologies Presents Podcasts from the 2007 LXI Consortium Meeting
Dec 11, 2007 | Four new podcast interviews were recorded at the 2007 LXI Consortium. Available for listening immediately.
Agilent Technologies' New Gain Compression Application Optimizes Accuracy, Speed of Amplifier Test
Dec 11, 2007 | Agilent Technologies Inc. (NYSE: A) today announced the availability of a new Gain Compression Application (GCA) for its premier-performance PNA-X network analyzer.
Agilent Technologies and Multiprobe to Bring World's Highest-Resolution Nanoprober to Asia
Dec 05, 2007 | SANTA CLARA, Calif., Dec. 3, 2007 -- Agilent Technologies Inc. (NYSE: A) and Multiprobe Inc. today announced their intent to expand the companies' strategic partnership. As a result, Multiprobe's Multiscan Atomic Force Prober (AFP), the world's highest-resolution nanoprober, will be sold and supported by Agilent to customers in Asia and Japan.
Agilent Technologies' New IO Libraries Suite Simplifies Discovery
Nov 30, 2007 | SANTA CLARA, Calif., Nov. 26, 2007 -- Agilent Technologies Inc. (NYSE: A) today announced its IO Libraries Suite 15.0, which has an improved LAN-discovery interface that simplifies the finding and configuring of LXI and other LAN-capable instruments.
Agilent Technologies and Anite Announce Strategic Partnership to Deliver 3GPP LTE Test Solutions for Wireless R&D
Nov 12, 2007 | Agilent Technologies Inc. (NYSE: A) and Anite plc (LSE: AIE) today announced that they have entered into a strategic partnership to deliver industry-leading 3GPP Long Term Evolution (LTE) test solutions to wireless R&D engineers designing next-generation mobile communications products.
Agilent Technologies Signs Agreement to Acquire Velocity11, a Leader in Life Science Lab Automation and Robotics
Nov 12, 2007 | Agilent Technologies Inc. (NYSE: A) and Velocity11 today announced that they have signed a definitive agreement for Agilent to acquire Velocity11. Velocity11, privately held, is a leader in automated liquid handling and laboratory robotics for the life science market.
Agilent Technologies Facilitates Industry Deployment of PCI Express 2.0 with New Compliance Test Solution
Nov 08, 2007 | Agilent Technologies Inc. (NYSE: A), the provider of the gold standard Protocol Test Card I (PTC I), today introduced the PTC II for PCI Express(r) (PCIe(tm)) 2.0. The Agilent PTC II will enable device compliance with the PCI-SIG(r) (PCI Special Interest Group) specifications and industry deployment of PCIe by providing all the mandatory test cases.
Agilent Technologies to Launch New Automated Optical Inspection Platform at Productronica
Nov 08, 2007 | The Agilent Medalist sj5000 AOI solution targets post-reflow inspection and is designed on a flexible platform that is easy to use, helping printed circuit board manufacturers keep pace with the fast-changing demands of surface mount technology (SMT).
Agilent Technologies to Demonstrate Technology Leadership in Military Communications Solutions at MILCOM 2007
Oct 29, 2007 | Agilent Technologies Inc. (NYSE: A) today announced that it will demonstrate its leadership offerings in military communications solutions at MILCOM 2007, including the following application areas: R&D, RF, operational test, networking, physical layer test, and internet security and monitoring.
Industry's First Probing Solution for Oscilloscope Measurements in Extreme Temperatures.
Oct 29, 2007 | Agilent Technologies Inc. (NYSE: A) today announced the industry's first probing solution for making oscilloscope measurements in environmental chambers and in other settings with extreme temperature conditions.
Agilent Technologies' VEE 8.5 Offers Enhanced Programming Environment and Support for Windows Vista(TM)
Oct 23, 2007 | Agilent Technologies Inc. (NYSE: A) today introduced the enhanced version of the Agilent VEE 8.5 graphical programming software for test and measurement, equipping users with more functions and support for the latest software tools and operating systems in the industry, including Windows Vista.
Agilent Technologies' LXI-Based Oscilloscopes Make Industry Magazine's Annual Top-Products List
Oct 11, 2007 | Agilent Technologies Inc. (NYSE: A) today announced it has received an award for innovation from Mesures magazine, a Paris-based monthly that reports on instrumentation and industrial automation. In its 12th annual Palmars Technologique awards, Mesures highlighted Agilent's 6000L Series low-profile oscilloscopes, which are based on the LAN eXtensions for Instrumentation (LXI) standard and are optimized for use in test systems.
Agilent Technologies Announces Webcasts on Semiconductor Test
Oct 10, 2007 | Engineers and scientists face many difficulties when characterizing advanced semiconductor processes. In these webcasts information will be provide on how to solve measurement challenges, how to optimize cost versus performance and also be introduced to EasyExpert software used for CV to HFCV measurements.
Agilent Technologies to Host Board Test User Group Meetings in California
Sep 27, 2007 | Learning, sharing and conversing about experiences as a user can be invaluable to implementation success. Users of Agilent's Medalist Automated Optical
Agilent Technologies Wins Multimillion-Dollar, Five-Year Contract with U.S. Navy
Sep 25, 2007 | Agilent Technologies Inc. (NYSE: A) today announced that the U.S. Navy has selected the company's test equipment for the General Purpose Electronic Test Equipment program.
Agilent Technologies Introduces DDR1 Compliance Software for Infiniium Series Oscilloscope.
Sep 17, 2007 | Agilent Technologies Inc. (NYSE: A) today announced a new oscilloscope-based DDR1 (double data rate 1) compliance test application. This tool is ideal for engineers who need to validate and characterize DDR1 designs for computer, data storage, electronic data processing and consumer products.
Agilent to Exhibit Board Test Portfolio at IPC Midwest and Host User Group Meeting
Sep 11, 2007 | Chicago, IL Area
Test Strategist Presents Defect Level Study and Test Effectiveness
Aug 27, 2007 | offered by Surface Mount Technology Association (SMTA)
Agilent Technologies Introduces GPIB Interface Card that Delivers High Transfer Rate in Half-Height PCIe Card
Jun 07, 2007 | Agilent Technologies Inc. (NYSE: A) today introduced a PCIe-GPIB half-height interface card for compact next-generation PCs that harnesses the fast data transfer rate of PCI Express to support high-bandwidth PC applications.
Agilent Technologies Receives Frost & Sullivan's 2003 Product Line Award for Printed Circuit Board Test and Inspection Solutions
May 16, 2003 | Agilent 5DX Series 5000 also named 2003 Product of the Year by Frost & Sullivan's surface mount technology and electronic components group
Celestica Selects Agilent Technologies' New Automated X-ray Test System
Apr 08, 2003 | Complete test solution increases quality and reliability for complex printed circuit assemblies
Agilent SJ50 Series II and its Patent-pending Solid Shape Modeling
Apr 01, 2003 | Setting a New Standard in AOI PCB Inspection
Agilent Introduces Three-Week Solutions Tour
May 14, 2002 | The One-day Seminar Series Will be Held in 12 U.S. and Canadian Cities
Agilent Technologies Appoints Jack Trautman to Lead Automated Test Group
May 09, 2002 | Trautman Replaces John Scruggs
Amkor and Agilent expand outsourcing agreement
Jan 17, 2002 |
W. L. Gore & Associates, Inc., Agilent Technologies, and Mitel Agree to Common Standard for 12 Channel Parallel Optic Modules
Feb 12, 2001 | W. L. Gore & Associates, Agilent Technologies, and Mitel Corporation today announced that they have signed a Multi-Source Agreement (MSA) that will set the industry standard for next-generation parallel fiber optic modules. The three companies have leveraged their wide range of experience in fiber optic and semiconductor technologies to standardize the package and optical and electrical interfaces for their respective modules to ensure that customers will have access to multiple international sources that are compatible with other components within their systems. Each of the companies expects to offer the modules in 2001.
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