Jan 08, 2014 | Agilent Technologies revealed the name of the electronic measurement company it expects to spin off in early November 2014 as Keysight Technologies.
Jun 29, 2010 | Agilent Technologies’ interest in boundary scan test support grows with its second JTAG test systems move in a month.
Jun 20, 2009 | Agilent Technologies Inc. (NYSE: A) today kicked off its Agilent Digital Measurement Forum (ADMF) in Seoul, Korea. The annual forum, which brings together local and global industry leaders to address all digital-related measurement solutions from consumer electronics to high-speed digital design, will be held in six countries in the Asia-Pacific region from June 18 to July 16. Partners and collaborators such as Xilinx, The MathWorks and Microchip Technology are participating in the forum.
Feb 15, 2009 | Agilent's Aerospace and Defense Symposium begins a two-month U.S. tour on February 23, 2009. The symposium provides presentations and demonstrations on how to combine design tools with cutting edge test solutions to help you build greater assurance in system readiness so you can focus on today's challenging missions.
Jan 21, 2009 | The Medalist SP50 Series 3 Dual Laser SPI System Offers Defect Coverage Down to 01005 Level
Dec 06, 2008 | Agilent Technologies Inc. (NYSE: A) today announced it is demonstrating its comprehensive femtocell design and test capabilities here at the Femtocells USA event, Dec. 1-3. Included in its offering is the first 3GPP LTE femtocell test system used to test reference design.
Nov 19, 2008 | SANTA CLARA, Calif., and SAN JOSE, Calif., Nov. 18, 2008
Oct 01, 2008 | Agilent's R&D scientists for In-Circuit Test solutions will be presenting at various sessions throughout the conference.
Sep 24, 2008 | sj5000 Selected
Sep 08, 2008 | Agilent Technologies Inc. (NYSE: A) today introduced a new member of the function/arbitrary waveform family that delivers high-quality waveforms at an economical price. For design development and test engineers who need lower-frequency signals without sacrificing accuracy, this new instrument easily generates the waveforms needed for bench and system applications.
Sep 08, 2008 | Agilent Technologies Inc. (NYSE: A) today released a display tester designed for easy, customizable setup for visual testing of up to five major display formats. It is suitable for testing FPD and CRT displays as well as LCD panels in PC and TV manufacturing.
Aug 22, 2008 | Agilent Technologies Inc. (NYSE: A) today introduced advanced software for making precise phase-locked loop (PLL) measurements, also called jitter transfer measurements. Used with the Agilent 86100C DCA-J wideband oscilloscope, the software can test a wide variety of PLL designs and has been approved by the PCI-SIG(r) (PCI Special Interest Group) to perform PCI Express(r) (PCIe) PLL compliance measurements.
Aug 22, 2008 | Agilent Technologies Inc. (NYSE: A) today announced that it has added an extended interface module for Active State Power Management (ASPM) testing to its E2960B Series for PCI Express (PCIe(tm)) protocol test. This module provides lock of 11 Fast Training Sequences, the fastest lock time on the market.
Aug 11, 2008 | Agilent Technologies Inc. (NYSE: A) today announced the addition of the 2/4 port, 20 GHz option to its ENA network analyzers, as well as the introduction of a new E5092A configurable multiport test set. The new offerings bring best-in-class RF performance over a wide frequency range, fast measurement speed and multiport measurement capability to the ENA network analyzers. They also increase productivity, reduce cost of testing and are ideal for designers and manufacturers of passive components used in consumer-based wireless communications applications.
Aug 01, 2008 | Agilent Technologies Inc. (NYSE: A) today announced shipment of its Genesys 2008.07 release. The new Genesys release contains improvements to the reliability of artwork masks for electromagnetic (EM) verification and RF board manufacturing, along with modeling and user interface improvements. This functionality results in shorter design cycles with fewer iterations for RF designers with tight deadlines and budgets.
Aug 01, 2008 | Agilent Technologies Inc. (NYSE: A) today announced that its N9201A Array Structure Parametric Test Solution won the Semiconductor International 2008 Editor's Choice Best Product Award for excellence in semiconductor manufacturing. The Editor's Choice Best Product Award recognizes proven products that have been acknowledged by users for providing superior performance and capabilities in semiconductor manufacturing.
Jul 19, 2008 | Agilent's new "RF and Microwave Switch Selection Guide" provides comprehensive information on Agilent's entire portfolio of switches, which is comprised of both electromechanical and solid state switches. Packed with information, this guide provides you with all the technical information you need to select the right switch for your application.
Jul 19, 2008 | Agilent Technologies Inc. (NYSE: A) today announced the availability of scanning microwave microscopy (SMM) mode, a unique imaging technique that combines the comprehensive electrical measurement capabilities of a performance network analyzer (PNA) with the outstanding spatial resolution of an atomic force microscope (AFM).
Jul 08, 2008 | Agilent Technologies Inc. (NYSE: A) today introduced the U8000 Series single-output, non-programmable DC power supplies, a low-cost expansion of the best-selling Agilent E3600 Series. Beyond cost savings, these DC power supplies offer excellent value with features that are typical only in costly programmable models. With power ranging from 90 W to 150 W, they are suitable for a variety of electronics-manufacturing applications and provide reliable, affordable power for educational uses.
Jun 16, 2008 | Agilent Technologies Inc. (NYSE: A) today introduced two additional modules for its 34980A multifunction switch/measure unit. The modules extend this solution's high-performance capabilities with even higher switching density and flexible measurements with automatic surge protection. These high-density modules are a cost-effective alternative to PXI and VXI test platforms.
Jun 12, 2008 | Agilent Technologies Inc. (NYSE: A) today announced new integrated attenuation control units operating in the DC to 6, 18 and 26.5 GHz frequency range. The instruments feature up to 121 dB of attenuation with selectable step values and a programmable attenuation sweep function that enables user-defined sweep time, attenuation values and number of cycles.
Jun 12, 2008 | Agilent Technologies Inc. (NYSE: A) today announced new software capabilities for its E2960B Series protocol analyzer and LTSSM exerciser solution. The software package supports the PCI-SIG Single-Root I/O Virtualization (SR-IOV) and Multi-Root I/O virtualization (MR-IOV) specifications and builds on the PCI Express(r) (PCIe(r)) protocol stack, which makes it possible to run multiple systems' images on a common hardware platform.
Jun 03, 2008 | Agilent Technologies Inc. (NYSE: A) today announced nonlinear vector network analyzer (NVNA) capability for its PNA-X microwave network analyzer, establishing a new industry standard in RF nonlinear network analysis from 10 MHz to 26.5 GHz.
May 30, 2008 | Agilent Technologies Inc. (NYSE: A) today introduced a family of USB-based instruments designed for flexible configurations, quick setup, and affordability in electronic functional test and troubleshooting applications. The compact Agilent U2700A family includes oscilloscopes, function generator, source/measure unit and switch matrix in a versatile form factor that enables space-saving solutions.
May 12, 2008 | Agilent Technologies Inc. (NYSE: A) today announced that its Infiniium 90000A Series 13-GHz oscilloscopes have been approved by the PCI-SIG (PCI Special Interest Group) for PCI Express (PCIe(r)) 2.0 electrical signal quality testing. This approval means designers can use Agilent's DSO/DSA91304A Infiniium oscilloscope to test and validate their designs with confidence they will meet PCIe physical layer specifications.
May 12, 2008 | Agilent Technologies Inc. (NYSE: A) today introduced the industry's only flying leads probing solution for its PCI Express (PCIe) 2.0 E2960B Series analyzers. The flying leads probe 2.0 allows access to PCIe 2.0 links with no designed-in connectors at both 2.5 Giga Transfer per second (GT/s) and 5.0 GT/s rates. This type of probing access is essential for debugging embedded designs.
May 06, 2008 | Agilent Technologies Inc. (NYSE: A) today announced that its recently introduced test and inspection innovations have won several industry awards at two major tradeshows in April:
May 03, 2008 | Agilent Technologies Inc. (NYSE: A) today announced that its N6705A DC Power Analyzer has won five more industry awards, bringing the total to seven industry awards since this product was introduced in May 2007. Leading industry publications give these awards to acknowledge the unique contribution a product or service makes in the market.
May 03, 2008 | PCI Express brought about a whole new series of challenges for designers and the next generation. PCI Express 2.0 takes the challenges to a new level. Doubling the speed of the link to 5 GT/s, while maintaining backwards compatibility with PCI Express 1.0 potentially opens up interoperability issues. This presentation describes the methods and tools required to validate PCI Express 2.0 designs.
Apr 24, 2008 | Agilent Technologies Inc. (NYSE: A) and the Zollner Group today announced that Zollner, a global electronics manufacturing services provider, has selected the Agilent Medalist x6000 Automated X-ray Inspection (AXI) system to enhance its test and inspection capabilities.
Apr 22, 2008 | Agilent Technologies Inc. (NYSE: A) and the Zollner Group today announced that Zollner, a global electronics manufacturing services provider, has selected the Agilent Medalist x6000 Automated X-ray Inspection (AXI) system to enhance its test and inspection capabilities.
Apr 21, 2008 | A new technical overview with a self-guided demonstration is now available for WiMAX test developers and application engineers.
Apr 17, 2008 | Agilent Technologies Inc. (NYSE: A) today announced that Universal Scientific Industrial Co. Ltd. (USI) will use Agilent's WiMAX(tm) manufacturing networking test set for its Mobile WiMAX test needs. The company chose Agilent because of its ability to deliver fast measurement time for USI's Mobile WiMAX module test plan requirements. USI is a leader in the design and manufacturing services (DMS) industry that focuses on product development and capability enhancement.
Apr 17, 2008 | Agilent Technologies Inc. (NYSE: A) today announced that its recently introduced test and inspection innovations have won several industry awards at two major tradeshows in April
Apr 15, 2008 | Agilent Technologies Inc. (NYSE: A) today demonstrated the industry's first integrated HDMI physical layer, EDID, CEC and HDCP tests. This integration of the Quantum Data 882 into Agilent's Test Automation Software Platform provides the broadest video test coverage available. The Quantum Data 882 is an instrument recommended by the HDMI Compliance Test Specification for a range of protocol tests.
Apr 15, 2008 | Agilent Technologies: Interview at APEX 2008 with Stacey Johnson, Marketing Development Manager, Americas Field Marketing and Jeff Bossenbroek, Business Development Manager, Electronic Manufacturing Test
Apr 09, 2008 | Agilent's Solution Helped Allion Become the First Worldwide VESA-Authorized Test Center for DisplayPort
Apr 07, 2008 | Mentor Graphics Corp. (NASDAQ: MENT), the market and technology leader in printed circuit board (PCB) design solutions, and Agilent Technologies Inc. (NYSE: A), the market and technology leader in RF design solutions, today announced a jointly developed solution that can significantly improve productivity for the design of RF circuits on printed circuit boards (PCBs). The industry-first solution is expected to cut PCB design cycle times in half and improve the quality of mixed-technology designs.
Apr 07, 2008 | Agilent Technologies Inc. (NYSE: A) today introduced a new Automated Optical Inspection (AOI) platform that is fully qualified for all areas of surface mount technology (SMT) line inspection, including post-, pre- and 2-D capabilities. Agilent is demonstrating this platform here through April 3.
Mar 27, 2008 | Agilent Technologies Demonstrates Industry's First Completely Automated DisplayPort Physical Layer Compliance Test Solution
Mar 27, 2008 | Agilent Technologies Inc. (NYSE: A) today announced that it has received the 2008 Supply Chain Operational Excellence Award for its effective use of resources to achieve greater business results through exceptional management. Each year, the Supply-Chain Council recognizes organizations that understand the critical role of, and are committed to optimizing, supply-chain performance.
Mar 24, 2008 | Agilent Technologies Inc. (NYSE: A) today announced that its Protocol Test Card (PTC) 2.0 has been approved by the PCI-SIG(r) (PCI Special Interest Group) for PCI Express(r) (PCIe(r)) 2.0 protocol testing. This approval means designers can use Agilent's PTC 2.0 to test and validate their designs with the confidence that the PCIe specifications for link layer, transaction layer and BIOS are being met.
Mar 24, 2008 | Agilent's Triple Play Analyzer Accelerates Development, Deployment and Enables Monitoring of AVS-Based IPTV Network, Enabling Faster Time to Market
Mar 20, 2008 | Several authors from Agilent's Digital Test Division have written chapters about High-Speed Physical Layer Characterization in the new Digital Communications Test and Measurement Handbook, co-edited by Dennis Derickson, California Polytechnic State University and Marcus Mueller, Agilent. The book covers basics, transmitter test, receiver test, and interconnect topics to verify system performance of high-speed digital links.
Mar 20, 2008 | Agilent Technologies Inc. (NYSE: A) today unveiled a limited access solution for In-Circuit Test (ICT) users that eliminates the need for physical test points, offering benefits that traditional VTEP test cannot provide.
Mar 20, 2008 | Agilent Technologies Inc. (NYSE: A) today announced a new firmware release for its E5052B Signal Source Analyzer -- making it more convenient and flexible for use in phase-noise and jitter measurements.
Mar 19, 2008 | Agilent Technologies Inc. (NYSE: A) today introduced an RF switch platform designed to simplify the task of defining and building a custom switch matrix. The Agilent L4490A/91A RF switch platform allows R&D and manufacturing engineers to cut their RF switch development time by up to 50 percent.
Mar 09, 2008 | Agilent Technologies Inc. (NYSE: A) today introduced two modules for its Agilent N6700 Modular Power System family that deliver quick and accurate measurements of microamp current for a device under test (DUT). For R&D engineers designing integrated circuits and electronic devices that run on batteries, these power supplies measure current consumption and its effect on battery run time.
Mar 05, 2008 | Latest AOI platform and tools will also make their debut at the show. Be sure to visit Agilent at Booth #1735, APEX 2008, April 1-3, Mandalay Bay Resort and Convention Center, Las Vegas.
Mar 04, 2008 | Agilent Technologies Inc. (NYSE: A) today announced the latest release of its firmware for the Agilent N6705A DC Power Analyzer, which incorporates more than 25 customer-recommended enhancements.