Electronics Manufacturing Technical Articles

Electronics Manufacturing Technical Articles

Article posted by Foresite Inc.


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How Clean is Clean Enough – At What Level Does Each of The Individual Contaminates Cause Leakage and Corrosion Failures in SIR?

Published:

September 8, 2016

Author:

Terry Munson, Paco Solis, Nick Munson, Steve Ring, Evan Briscoe.

Abstract:

In this investigation a test matrix was completed utilizing 900 electrodes (small circuit board with parallel copper traces on FR-4 with LPI soldermask at 6, 10 and 50 mil spacing): 12 ionic contaminants were applied in five concentrations to three different spaced electrodes with five replicas each (three different bare copper trace spacing / five replications of each with five levels of ionic concentration). The investigation was to assess the electrical response under controlled heat and humidity conditions of the known applied contamination to electrodes, using the IPC SIR (surface insulation resistance) J-STD 001 limits and determine at what level of contamination and spacing the ionic / organic residue has a failing effect on SIR....

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Company Information:

Foresite Inc.

Foresite is a process consulting house and analytial laboratory dedicated to solving product reliability challenges for electronics manufacturers.

Kokomo, Indiana, USA

Cleaning, Consultant, Service Provider, Test Services

  • Phone (765)457-8095
  • Fax (765)457-9033

Foresite Inc. website

Company Postings:

(2) technical library articles

(1) news release

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  • Technical Library
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  • How Clean is Clean Enough – At What Level Does Each of The Individual Contaminates Cause Leakage and Corrosion Failures in SIR?
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