Component Reliability After Long Term Storage
Published: |
December 3, 2009 |
Author: |
R. R. Madsen |
Abstract: |
Each year the semiconductor industry routes a significant volume of devices to recycling sites for no reliability or quality rationale beyond the fact that those devices were stored on a warehouse shelf for two years. This study identifies the key risks attributed to extended storage of devices in uncontrolled indoor environments and the risk mitigation required to permit safe shelf-life extension.... |
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