[PDF FILE REQUIRES ADOBE ACROBAT READER]This technology transfer was prepared by the Research Triangle Institute (RTI) as part of SEMATECH's Facility Fluids Project (S100). It is a compilation of information on existing facility fluids metric and te...

[PDF FILE REQUIRES ADOBE ACROBAT READER]0.25 um targeted test wafer specifications suggested by I300I for use in 1997 are detailed. Use of, and exceptions to, SEMI standards are noted. ...

[PDF FILE REQUIRES ADOBE ACROBAT READER]This document describes silicon wafer specifications suitable for International 300 mm Initiative (I300I) 180 nm demonstrations in 1998. The specifications were developed in conjunction with the I300I Silicon W...

[PDF FILE REQUIRES ADOBE ACROBAT READER]This document defines a set of standard test structures with which to benchmark the electrostatic discharge (ESD) robustness of CMOS technologies. The test structures are intended to be used to evaluate the... ...

[PDF FILE REQUIRES ADOBE ACROBAT READER]This document is an update to the 1994 Quality and Reliability Roadmap issued in support of the 1994 National Technology Roadmap for Semiconductors. This report revisits the challenges, constraints, priorities,...

[PDF FILE REQUIRES ADOBE ACROBAT READER]This document contains procedures, inquiries, and corresponding pass/fail criteria to be used during an equipment maturity assessment (EMA) to evaluate compliance to the guidance, standards, and requirements......

[PDF FILE REQUIRES ADOBE ACROBAT READER]Failure Reporting, Analysis, and Corrective Action System (FRACAS) is a closed-loop feedback path for collecting, recording and analyzing failures of both hardware and software data sets. This document describe...

[PDF FILE REQUIRES ADOBE ACROBAT READER]Tactical Software Reliability (TSR) is a methodology that complements Software Process Improvement (SPI) and addresses tactical issues. It is designed to significantly improve a target software product.... ...

[PDF FILE REQUIRES ADOBE ACROBAT READER]Efficiencies in design and test will play an increasingly important role in maintaining the semiconductor industry's historic annual reduction of 25-30% in cost per function. Special design techniques and arch...

[PDF FILE REQUIRES ADOBE ACROBAT READER]This document is a proposed specification for timing and verification of automatic test equipment (ATE). It was developed as part of SEMATECH's ATE Specification Standards (project S91). The proposed specifica...