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Technical Library articles |
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THE PROXIMITY OF MICROVIAS TO PTHs AND ITS IMPACT ON THE RELIABILITY OF THESE MICROVIAS
Published: |
May 30, 2007 |
Author: |
Universal Instruments Corporation |
Abstract: |
High Density Interconnect (HDI) technology is fast becoming the enabling technology for the next generation of small portable electronic communication devices. These methods employ many different dielectrics and via fabrication technologies. In this ... |
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Manufacturers at the Crossroads: ERP or Best-of-Breed Software?
Published: |
May 17, 2007 |
Author: |
Zontec, Inc |
Abstract: |
In the quest for quality, selecting the right Statistical Process Control (SPC) Software system doesn�t boil down to a simple functional �fit-to-requirements� anymore. Once the expert domain of highly focused, independent software developers, the com... |
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The Proximity of Microvias to PTHs And Its Impact On The Reliability
Published: |
May 09, 2007 |
Author: |
Universal Instruments Corporation |
Abstract: |
High Density Interconnect (HDI) technology is fast becoming the enabling technology for the next generation of small portable electronic communication devices. These methods employ many different dielectrics and via fabrication technologies...... |
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A Study of Lead-Free Wave Soldering
Published: |
May 02, 2007 |
Author: |
AIM |
Abstract: |
This brief study of lead-free wave soldering focuses upon copper dissolution and solder maintenance issues. Unfortunately, it is determined that waste and changeover costs can dramatically increase with lead-free wave soldering.... |
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Real-Time Yield Monitoring Through ERP Systems
Published: |
Apr 25, 2007 |
Author: |
Endicott Interconnect Technologies |
Abstract: |
Globalization and increased competition requires an enterprise to focus on cost reduction, improved manufacturing processes and higher standards of quality. Effective yield management using Enterprise Resource Planning (ERP) systems is crucial for th... |
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Fragility of Pb-free Solder Joints
Published: |
Apr 18, 2007 |
Author: |
Universal Instruments Corporation |
Abstract: |
Recent investigations have revealed that Pb-free solder joints may be fragile, prone to premature
interfacial failure particularly under shock loading, as initially formed or tend to become so under moderate thermal aging. Depending on the solder pa... |
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A Case Study in Troubleshooting Shop Floor Rework Difficulties
Published: |
Apr 05, 2007 |
Author: |
Martin H�gner, Martin Rework and Dispense Technic, Wessling/Munich, Germany, and Allen Sirois, Web Administrator, Manncorp Inc., USA |
Abstract: |
A global firm needing a fast solution for their new product, which couldn�t be properly soldered due to faulty solder joints, approached Germany�s Martin GmbH. Martin�s expertise and superior rework equipment located the problem, isolated it, and pre... |
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EFFECTS OF ASSEMBLY PROCESS VARIABLES ON VOIDING AT A THERMAL INTERFACE
Published: |
Apr 04, 2007 |
Author: |
Universal Instruments Corporation |
Abstract: |
Too often, the effects of assembly process parameters are not sufficiently accounted for in the optimization of thermal interface performance. This becomes increasingly critical as demands on this performance continue to grow and alternative processe... |
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LEAD-FREE REWORK PROCESS FOR CHIP SCALE PACKAGES
Published: |
Mar 28, 2007 |
Author: |
Universal Instruments |
Abstract: |
Legislation against the use of lead in electronics has been the driving force behind the use of lead-free solders, surface finishes, and component lead finishes. The major concern in using lead-free solders in the assembly and rework Chip
Scale Pack... |
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Endicott Interconnect Technologies, Inc. Awarded Multiple Department of Defense Contracts Totaling $164M
Published: |
Mar 27, 2007 |
Author: |
Endicott Interconnect Technologies, Inc. |
Abstract: |
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