| Now Online |
Visitors: 186 Members: 9 |
|
| Subscribe to the SMTnet Express |
|
|
|
| Link to SMTnet |
| Tell everyone you know about SMTnet! You can add this small image to your Web site and provide a link to us. Click here to learn how. |
 |
|
|
|
| |
 |
|

Technical Library articles |
|
Effects of Thermal Aging on Copper Dissolution For SAC 405 Alloy
Published: |
Jul 08, 2010 |
Author: |
Dr. Dana Medlin, Clay Voyles, Teneil Ryno, Casey Bergstrom, John Metzger, and Spencer Richards |
Company: |
Radiance Technologies
|
Abstract: |
Aging characteristics of new lead free solder alloys are in question by many experts because of higher amount of tin’s effect on the diffusion of other metals, primarily copper, to create undesirable boundary intermetallics over long periods of time and e... |
|
|
Power Supply Control from PCB to Chip Core
Published: |
Jun 30, 2010 |
Author: |
Nur Devnani, Eileen Murray |
Company: |
Avago Technologies
|
Abstract: |
As silicon technology advances to enable higher density ASICs, the core logic voltage decreases. The lower voltage, in combination with higher current requirements, requires tighter tolerances on the power supplies. The control of the power supplies from ... |
|
|
Conductive adhesives increase microchip packaging density
Published: |
Jun 24, 2010 |
Author: |
Jakob Gakkestad, Per Dalsjo, Helge Kristiansen, Rolf Johannessen, MaaikeM.V. Taklo |
Company: |
SPIE - International Society for Optical Engineering
|
Abstract: |
Interconnecting microelectromechanical systems directly to printed circuit boards can improve reliability and reduce costs of mediumcaliber
fuzes.... |
|
|
Next-Generation Test Equipment For High-Volume Wafer Production
Published: |
Jun 23, 2010 |
Author: |
Kay Gastinger, Odd Løvhaugen |
Company: |
SPIE - International Society for Optical Engineering
|
Abstract: |
Quality control is one of the main bottlenecks in the production of micro-opto-electromechanical systems/microelectromechanical systems (MOEMS/MEMS) because each structure on a wafer is serially inspected and scanned stepwise over the
entire wafer area. ... |
|
|
Effect Of Squeegee Blade On Solder Paste Print Quality
Published: |
Jun 17, 2010 |
Author: |
Rita Mohanty, Bill Claiborne, Frank Andres |
Company: |
Speedline Technologies, Inc.
|
Abstract: |
The solder paste deposition process is viewed by many in the industry as the leading contributor of defects in the Surface Mount Technology (SMT) assembly process. As with all manufacturing processes, solder paste printing is subject to both special and c... |
|
|
Validity of the IPC R.O.S.E. Method 2.3.25 Researched
Published: |
Jun 10, 2010 |
Author: |
Mike Bixenman, Steve Stach |
Company: |
Kyzen Corporation
|
Abstract: |
This paper researches the effectiveness of the R.O.S.E. cleanliness testing process for dissolving and measuring ionic contaminants from boards soldered with no-clean and lead-free flux technologies.... |
|
|
Strategies for Designing Microwave Multilayer Printed Circuit Boards Using Stripline Structures
Published: |
Jun 03, 2010 |
Author: |
Thomas McCarthy, Sean Reynolds, Jon Skelly |
Company: |
Taconic
|
Abstract: |
Strategies for successful design and manufacture of microwave multilayer printed circuit boards. All aspects from pad registration, dimensional stability, impedance fluctuation, fusion bonding, thermal ageing, z-axis expansion, reliability, to Young's mod... |
|
|
The Reliability Challenges of QFN Packaging
Published: |
May 27, 2010 |
Author: |
Randy Kong, Cheryl Tulkoff, Craig Hillman (presented at: SMTA China East Conference 2010) |
Company: |
DfR Solutions
|
Abstract: |
The quad flat pack no lead or quad flat non-leaded (QFN) is one of the fastest growing package types in the electronics industry today. While the advantages of QFNs are well documented, concerns arise with its reliability and manufacturability.... |
|
|
FlyScan: Wenn eins plus eins mehr als zwei ist
Published: |
May 24, 2010 |
Author: |
Bernd Hauptmann – Sales Manager Seica Deutschland GmbH |
Company: |
SEICA SpA
|
Abstract: |
Der Test von elektronischen Baugruppen erfordert heute intelligentere Werkzeuge die gleichzeitig schnell
und leicht zu bedienen sind, um den Anforderungen von hoher Qualität und Kosteneffektivität zu genügen,
welches das ideale Ziel im Fertigungs- und R... |
|
|
Testing Digital Designs – The Boundary-scan Balance
Published: |
May 20, 2010 |
Author: |
James Stanbridge, Steve Lees |
Company: |
JTAG Technologies B. V.
|
Abstract: |
As several industry pundits have expressed in recent years: "the era of 'one test method fits
all’ seems well behind us." For most test managers with even a modest mix of products, trying to formulate a test policy/philosophy has become a tricky balancin... |
|
|
|
|