Tektronix (Tek) 80E04 TDR Electrical Sampling Module, 20 GHz, 2 CH - Free Shipping

Tektronix (Tek) 80E04 TDR Electrical Sampling Module, 20 GHz, 2 CH - Free Shipping Description:

Features & Benefits

All Modules

• Up to 70 GHz Bandwidth and 5 ps Measured Rise Time (10-90%)Lowest Noise for Analysis: 450 μVRMS at 60 GHz, 300 μVRMS at 30 GHz
• Remote Samplers*1 enable Location of Sampler Near DUT and ensure Best Signal Fidelity
• Independent Sampler Deskew ensures Easy Fixture and Probe De-embedding
• Dual Channel (Except 80E01 and 80E11X1)
• Precision Microwave Connectors (3.5 mm, 2.92 mm, 2.4 mm, and 1.85 mm)

DR Modules

• 15 ps Reflected True Differential Fully Integrated TDR Rise Time (12 ps Incident) and feature Resolution Below 1 mm
• Efficient, Accurate, Easy to Use, and Cost-effective S-parameters up to 50 GHz

Applications

• Impedance Characterization and S-parameter Measurements for Serial Data Applications
• Advanced Jitter, Noise, and BER Analysis
• Channel and Eye-diagram Simulation and Measurement-based Spice Modeling 80E10B, 80E08B, and 80E04
• High-performance TDR/T Measurements
• Impedance Profile, Inductance, Capacitance, and S-parameters
• Transmission Line Quality, Impedance, and Crosstalk
• True Differential, Common Mode, and Single-ended Measurements
• Efficient Fault Isolation

TDR Modules: 80E10B, 80E08B, and 80E04

The 80E10B, 80E08B, and 80E04 are dual-channel Time Domain Reflectometry (TDR) sampling modules, providing up to 12 ps incident and 15 ps reflected rise time in the 80E10B (18 ps incident in 80E08B and 23 ps incident in 80E04). Each channel of these modules is capable of generating a fast step for use in TDR mode and the acquisition portion of the sampling module monitors the incident step and any reflected energy. The polarity of each channel’s step can be selected independently. This allows for differential or common mode TDR or S-parameter testing of two coupled lines, in addition to the independent testing of isolated lines. The independent step generation for each channel allows true differential measurements, which ensures measurement accuracy for differential devices.