TR8100LV In-Circuit Tester (ICT)

Company Information:

Test Research is the World's leading supplier of Test and Inspection Solutions in the PCBA Manufacturing Test & Inspection Industry. From 3D SPI, 3D AOI and 3D AXI Systems to MDA, ICT and Functional Test. Industry 4.0 Ready.

San Jose, California, USA

Manufacturer

408-567-9898
408-567-9288

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Company Postings:

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Name:	TR8100LV In-Circuit Tester (ICT)
Category:	Test Equipment - Bond Testers
Offered by:	TRI - Test Research, Inc. USA

TR8100LV In-Circuit Tester (ICT) Description:

Designed for testing large and complex PCBAs, the TR8100LV is TRI’s top-of-the-line board test system targeting the low-voltage testing market. TR8100LV’s vacuum system ensures full pin contact and with up to 3,584 pin digital MUX-free architecture, the system allows for faster and simpler testing of large pin-count devices and fast program development. Included *TRI ToggleScan® technology combines Boundary Scan with solutions for limited test access boards. *"ToggleScan®" are registered trademarks of Test Research, Inc.

Features:

• Digital 1:1 driver/receiver per pin architecture design
• High fault coverage test solution with vacuum fixture
• Low voltage device testing and rapid test speed
• Friendly UI with fast and easy program development

Specifications:

Tester Specifications

Analog/hybrid test points	TR8100LV: 3584 TR8100LLV: 5632
Operating System	Microsoft® Windows compatible PC with USB, Windows 7-10
Fixture Type	Offline press or vacuum type fixture

Standard Testing Components

Analog Test Hardware	6-wire measurement switching matrix Programmable AC/DC/DC High voltage and current sources AC/DC voltage, DC current measurement, frequency Component R/L/C measurement Synthesized Arbitrary Waveform Generator TestJet vectorless open circuit detection
Digital Testing	Non-multiplexing 1:1 per pin architecture with independent per-pin level setting DUT power supplies: 5 V@5 A, 3.3 V@5 A, 12 V@5A, 0.2~20 V@3 A and -3~-20 V@3 A On-board Flash, EEPROM, MAC programming

Optional Components

Analog Hardware	Fixture Conversion Kits for Teradyne, GenRad
Digital Testing	Programmable DUT power supplies: 75 V / 8 A, 200W maximum output power Includes BScan Chain Test, BScan Cluster Test, BScan Virtual Nails Test, BScan Virtual Chain Test and IEEE1149.6 Test
Yield Management System	YMS 4.0

Dimensions

WxDxH	TR8100LV: 1150 x 850 x 830 mm TR8100LLV: 1550 x 850 x 830 mm
Weight	TR8100LV: 390 kg TR8100LLV: 450 kg

TR8100LV In-Circuit Tester (ICT) was added in Feb 2018

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