SMT Equipment

TR5001 SII QDI Series In-Circuit Tester (ICT)

Company Information:

Test Research is the World's leading supplier of Test and Inspection Solutions in the PCBA Manufacturing Test & Inspection Industry. From 3D SPI, 3D AOI and 3D AXI Systems to MDA, ICT and Functional Test. Industry 4.0 Ready.

San Jose, California, USA

Manufacturer

  • Phone 408-567-9898
  • Fax 408-567-9288

See Supplier Website »

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TR5001 SII QDI Series In-Circuit Tester (ICT)

TR5001 SII QDI Series In-Circuit Tester (ICT)

Name:

TR5001 SII QDI Series In-Circuit Tester (ICT)

Category:

Test Equipment - Bond Testers

Offered by:

TRI - Test Research, Inc. USA

   

TR5001 SII QDI Series In-Circuit Tester (ICT) Description:

Next generation ICT+FCT solution offers breakthrough performance Multi-Core Parallel/Merged Core testing with up to 4 independent cores for high-throughput testing. TRI's most advanced manual handler features industry-approved hands-free safety design for uninterrupted operation, and built-in auto-calibration ensures long-term testing reliability.

Features:

• New Generation Flexible Multi-Core Parallel / Merged-Core Tester
• State-of-the-Art Serial Test Controller with up to 8 ports on any pin
• Industry-approved hands-free testing platform for maximum operator safety
• Limited access solution and functional test expansion using PXI modules
• Built-in Self Diagnostics and Auto-Calibration function
• High-Accuracy Measurement and Testing
• Intuitive UI with flow-based easy program development

Specifications:

Tester Specifications

Analog/hybrid test points

TR5001Q SII QDI: 4096

TR5001D SII QDI: 3328
TR5001 SII QDU: 3328

Operating System Microsoft® Windows compatible PC with USB, Windows 7-10
Fixture Type Offline press type fixture with QDI

Standard Testing Components

Analog Test Hardware
  • 6-wire measurement switching matrix
  • Programmable AC/DC/DC High voltage and current sources
  • AC/DC voltage, DC current measurement
  • Component R/L/C measurement

Optional Components

Analog Hardware
  • TestJet vectorless open circuit detection
  • Arbitrary Waveform Generator
Digital Testing
  • Non-multiplexing 1:1 per pin architecture with independent per-pin level setting
  • DUT power supplies: 5 V@3 A, 3.3 V@3 A, 12 V@3A, -12 V@1 A and 24 V@3 A
  • Programmable DUT power supplies: 75 V / 8 A max, 200W maximum output power
  • Includes BScan Chain Test, BScan Cluster Test, BScan Virtual Nails Test, BScan Virtual Chain Test and IEEE1149.6 Test
  • Up to 8 High Speed Serial Ports, On-board Flash, EEPROM, MAC programming
Yield Management System YMS 4.0

Dimensions

WxDxH

1200 x 950 x 1850 mm

Weight 700 kg

TR5001 SII QDI Series In-Circuit Tester (ICT) was added in Feb 2018

TR5001 SII QDI Series In-Circuit Tester (ICT) has been viewed 1570 times

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