The Test Connection, Inc

The Test Connection Inc. is a integrator of test solutions for In-Circuit Test, Flying Probe, Boundary Scan and Functional Test. TTCI supports Agilent 3070, Teradyne TestStation/228x, Digitaltest Condor, Seica Pilot V8, XJTAG

Consultant / Service Provider, Distributor, Manufacturer

The Test Connection Inc. (TTCI) can save money and time for you with one of our professional services. Quality test engineering solutions with complete documentation allow our team to support needs from the earliest design stages to test development and testing of your product.
 
Leading the Way in Electronic Test Engineering


TTCI has been supporting the electronics test arena for over three decades by offering printed circuit test solutions.

Our services range from:

  • In-Circuit Test (ICT) development and board testing services for Agilent 3070 and Teradyne (GenRad) TestStation/GR228X test systems
  • Flying Probe development and board testing services on our Digitaltest MTS500XL and Seica Pilot4D V8 flying probe test systems
  • Boundary-Scan Test Solutions with the XJTAG and Agilent x1149 systems
  • Functional Test Solutions with the TS-5000 & TS-8900 PXI based systems and custom benchtop ATE

The Test Connection, Inc Postings

2 products »

Flying Probe Testing

TTCI offers the complete solution for customers who want maximum performance: the highest test speed, test coverage and flexibility, whether they are testing prototypes, manufacturing batches, or repairing any type of boards. Flying probe t...

Test Services

Flying Probe Testing

InteFun 2700 & Functional Test Solutions

The InteFun2700 and functional test services offer industry proven components that build a functional test strategy for a broad range of manufacturing test applications. Designed for production testing, our solutions are optimized for reliability, th...

Test Services

InteFun 2700 & Functional Test Solutions

2 news releases »

New Equipment – New Partnership

Apr 30, 2014 | TTCI just bought the new Seica Pilot V8 Flying Probe!

Design For Test (DFT) Training

Feb 04, 2010 | Featurng JTAG and BIST

ICT Total SMT line Provider

Void Free Reflow Soldering