SMP - Surface Measurement Motion Platform

SMP - Surface Measurement Motion Platform Description:

Complete Multi-axis Motion System

The SMP is a complete multi-axis motion system that is specifically designed to provide an ideal motion platform for surface measurement applications. The SMP is optimized to provide more flexibility in 2D and 3D contouring, higher precision with nanometer resolution, significantly reduced processing time, and minimal footprint. View the complete product sheet for more information.

More Flexibility

• 2D and 3D contouring
• Measurement of spherical, aspheric, and cylindrical shapes (Application example: precision optical component measurement)
• Scanning or point-to-point motion profiles
• Available in multiple configurations
• Generic high-speed electrical interface between the motion and sensor controller
• Open architecture software to integrate a large variety of sensors such as white light or multi-wavelength interferometers, camera systems, or capacitive probes
• Easy-to-use, advanced motion algorithms ease motion profile generation

Higher Precision

• Axis repeatability in the low nanometer range
• Nanometer-level minimum incremental motion (resolution)
• Ultra-smooth motion even at very low velocities
• Reduced processing time
• Save up to 40% of measurement time compared with conventional Cartesian systems
• Real-time communication between motion and sensor controller provides synchronization of measurement and position data
• Fast data access during the measurement and intelligent data management

Minimal Footprint

• 60% footprint savings compared to Cartesian systems