The JT 5705 series offer a unique combination of JTAG TAP controller (tester) interfaces plus digital and analog I/O in compact desktop package.
Measure power supplies, clock frequencies or test DACs and ADCs. Add your own capability through use of CoreCommander FPGA our generic bridge/...
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Test Equipment |
Measures DIO, Analog Voltage and Frequency in One Module.
The JT 2149/DAF is a compact, mixed-signal (Digital/Analog/Frequency) measurement module and is the first unit of its type to offer both digital and analogue test access to PCBs via JTAG Technologies’ widely-used QuadPod ...
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Test Equipment |
Want to improve the overall test coverage of your assembled boards? It’s easy. Simply combine your JTAG Technologies boundary-scan tools with your existing automatic test equipment (ATE). We work with any vendor of in-circuit testers (ICT), flying probes (FPT) or functional testers (FT).
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Test Equipment |
The JT 37x7/RMI (rack mountable instrument) consists of a fully featured DataBlaster boundary-scan controller, equipped with four TAPs, plus 256 DIOS I/O channels, all packaged in a convenient 1U, 19-inch rack-mount unit. The RMI is ideal for use in test systems where demandin...
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Test Equipment |
The JT 3705/USB Explorer is a low-cost boundary-scan controller specifically suited for low volume testing and in-system programming of (c)PLDs. Explorer supports two fully-compliant boundary-scan test access ports (TAPs) which can be synchronized for test purposes.
Fast test ex...
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Test Equipment |
The JT 37x7 DataBlasters are a family of high-performance, 40 MHz, boundary-scan controllers. The controllers are targeted at demanding manufacturing applications and fast in-system Flash memory programming. The JT 37x7 is available in different form factors and operating levels to suit your spec...
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Test Equipment |
The JT 5745/RMI offers high performance JTAG TAP controller (tester) interfaces plus digital and analog I/O in compact 1U by 19" rackmount package.
Measure power supplies, clock frequencies or test DACs and ADCs. Add you own capability through use of CoreCommander FPGA our ge...
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Test Equipment |
The boundary-scan I/O modules provide an effective means of increasing test coverage on the target board and improving the diagnostic resolution of boundary-scan testing. The modules are grouped into two general classifications: general purpose digital I/O scan (DIOS) modules and socket test modu...
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Test Equipment |
The JT 2139 is a TAP signal isolation module designed for use in 'combinational' test systems that utilise multiple instrument interfaces. To avoid parasitic capicitance effects and/or unwanted ground loops the JT 2139 can be used to completely galvanically isolate any JTAG Technolog...
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Test Equipment |
The JT 2154 is an experiment board based on National Semiconductor's STA111 device, aimed at users looking to utilise addressable multiplexors within their designs, and thus set-up 'system level' JTAG access. The unit is also widely used in semi-permanent installations to expand the T...
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Test Equipment |
JTAG TapCommunicator facilitates remote execution and diagnostics of boundary-scan applications, regardless of distance or environmental difficulties. The off-the-shelf system is based on a one gigabit Ethernet connection (IEEE Std 802.3z) providing virtually unlimited range between the con...
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Test Equipment |
Using a sample boundary-scan IC, the JTAG Technologies BSDL generation/verification system automatically verifies the existing BSDL (Boundary-Scan Description Language) file or creates a BSDL file for the device if none exists, all in accordance with the IEEE 1149.1b Boundary-scan Standard. A BSD...
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Test Equipment |