37th International Symposium for Testing and Failure Analysis (ISTFA)
Category |
|
Date: |
Sun, November 13 - Thu, November 17, 2011 |
Description: |
The Microelectronics Failure Analysis Event of the Year.Share your experiences; advance the industry and your career at the premier event for the microelectronics failure analysis community. The ISTFA technical symposia, user groups, education opportunities and the largest equipment exposition in the industry, make ISTFA the best place to learn, network and further your career. Take advantage of:
Keynote Presentation - Dr. Joseph Michael from Sandia Be certain to arrive early for our keynote presentation by world renowned microscopist and ASM member Dr. Joseph Michael of Sandia National Laboratories. In keeping with our theme of “Finding the Invisible Defect”, Dr. Joseph Michael will present the work from him and his team on the tools and analysis used to identify the origins of the anthrax spores sent to our congressional representatives in Washington DC. Technical Sessions:
Tutorial Program - November 13 - 14, 2011 The ISTFA 2011 Tutorial is a comprehensive series of lectures designed to provide in-depth coverage of key topics relating to failure analysis, including critical focus areas such as fault localization, FIB, and microscopy. Tutorial Topics:
|
Url: |