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Component failure analysis

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#35636

Component failure analysis | 19 July, 2005

What are possible failure analysis (destructive or non-destructive and what are the pro/cons) I could conduct on the component level (of an IC) to determine failure mode/root cause?

We are measuring internal shorts between leads on a SOIC after soldering. Troubleshooting has pointed towards that failure is component (not soldering process) related. I am looking for an independent lab that can offer such service.

Rgds, Peter

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#35638

Component failure analysis | 19 July, 2005

One step is to examine the cleanliness on and around the failing component. There could be an ionic contaminant causing the shorts.

Regards, Sara Gorcos www.residues.com

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#35641

Component failure analysis | 19 July, 2005

This is a bit dated, but it'll give you a starting point.

test lab failure analysis IC; Accurel Materials Analysis Group (FIB, FESEM,TEM) 785 Lucerne Dr Sunnyvale, CA 94086; 408-737-3892 Fax 3916 Suzanne Francisco X146 suzannef@accurel.com

test lab failure analysis IC; Integra Technologies (Bell Lab/ Lucent) 3450 N. Rock Rd Building 100 Suite 111 Wichita, KS 67226; 800-622-2382 Kent Wade VP Sales test lab failure analysis IC; Integra Technologies ESD Lab 2600 San Tomas Expy PC-015 Santa Clara, CA 95051; 800-622-2382; Kent Wade VP Sales test lab failure analysis IC; Advanced Research Technologies; 2300 Alfred Nobel, Saint-Laurent, Qu�bec H4S 2A4; 514-832-0777 Fax 0778 test lab failure analysis IC; Integrated Circuit Engineering; 15022 N. 75th St Scottsdale AZ 85260-2476; (602) 998-9780 http//www.ice-corp.com/ice

test lab failure analysis IC; Hi Rel Laboratories; Spokane, WA; 509-325-5800 test lab failure analysis IC; Riga Labs; Sunnyvale, CA; 408-496-6944 test lab failure analysis IC; Centre for Microanalysis, Semiconductor Components Group, Nortel 185 Corkstown Rd, Nepean P.O. Box 3511, Station C, Ottawa Ontario CANADA K1Y 4H7; ; Ian Few, Manager test lab failure analysis IC; SEAL Laboratories; 250 North Nash St, El Segundo, CA. 90245; 310-322-2011 Fax2243 test lab failure analysis IC; Accurel Systems International 785 Lucerne Dr Sunnyvale, CA 94085; 408-737-3892 Fax: 3916 http://www.accurel.com/

test lab failure analysis IC; Analytical Solutions, Inc.; 10401 Research Rd. SE Albuquerque, NM 87123-3423; (505) 299-1967 fax (505) 292-0225 http://www.analyticalsol.com

test lab failure analysis IC; Charles Evans & Associates; 810 Kifer Rd, Sunnyvale, CA 94086; 408-530-3500 Fax: 3501 info@eaglabs.com http://www.cea.com/home.htm

test lab failure analysis IC; FIB International, Inc.; 1700 Wyatt Drive, Suite 8 Santa Clara, California 95054; (408) 567-8068 Fax: 8059 http://www.fibinternational.com/

test lab failure analysis IC; FIB Lab Inc.; 1574 Centre Pointe Dr, Milpitas, CA 95035; 408-942-6883 http://www.fiblab.com/

test lab failure analysis IC; Insight Analytical Labs, Inc.; Colorado Springs, CO 719-570-9549 info@ial-fa.com http://www.ial-fa.com/

test lab failure analysis IC; IRSI Corp; 10225 Barnes Canyon Rd, San Diego, California 92121; 858-658-9770 FAX: 858-550-9445 info@irsi.com http://www.irsi.com/

test lab failure analysis IC; PhotoMetrics, Inc.; 15801 Graham St., Huntington Beach, CA 92649; 714-895-4465 fax 714-893-4682 lab@photometrics.net http://www.photometrics.net/

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#36067

Component failure analysis | 11 August, 2005

Hi Peter,

I'm not sure where you're located, but I work for Celestica in our Component Failure Analysis and Reliability Testing Lab in Toronto Ontario Canada. We are an idenpendent lab with full FA component, assembly and PWB capabilities and would be more than happy to discuss your analysis needs. We follow a very methodical step by step problem solving procedure to perform all non-destructive testing, e.g. visual, x-ray, C-SAM, electrical verification followed by the required destructive testing e.g. decapsulation, cross-sectioning, SEM/EDX, etc. etc.

Cheers, Jason

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MMurison

#36259

Component failure analysis | 23 August, 2005

MUAnalysis is an independent lab for Component Failure Analysis and Reliability Testing in Ottawa, Ontario Canada. We also would be pleased to discuss your analysis needs.

We also perform all non-destructive testing, e.g. visual, x-ray, C-SAM, electrical verification as well as the required destructive testing e.g. decapsulation, and precision cross-sectioning, SEM/EDX

Visit our website for further details: http://www.muanalysis.com

Cheers, Melody

2301 St-Laurent Blvd. Suite 500 Ottawa ON Canada K1G 4J7 tel: 613-721-4664 x232 toll free North America 1-866-238-4664 fax: 613-721-4682

mmurison@muanalysis.com

www.muanalysis.com

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